Structural, electrical, and optical properties of Zn1−xSnxO thin films deposited by reactive co-sputtering
Version of Record online: 13 AUG 2013
© 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
physica status solidi (a)
Volume 210, Issue 11, pages 2404–2408, November 2013
How to Cite
Ye, F., Zhong, X., Cai, X.-M., Huang, L.-B., Roy, V. A. L., Jing, S.-Y., Zhang, D.-P., Fan, P., Luo, J.-T. and Tian, X.-Q. (2013), Structural, electrical, and optical properties of Zn1−xSnxO thin films deposited by reactive co-sputtering. Phys. Status Solidi A, 210: 2404–2408. doi: 10.1002/pssa.201329266
- Issue online: 20 NOV 2013
- Version of Record online: 13 AUG 2013
- Manuscript Accepted: 3 JUL 2013
- Manuscript Revised: 22 MAY 2013
- Manuscript Received: 23 APR 2013
- National Natural Science Foundation of China. Grant Numbers: 61204010, 11174208
- Shenzhen City R&D funding for Science and Technologies–Basic Research Programs. Grant Numbers: JC201005280405A, JCYJ20120613102126217, JCYJ20120613172752576
- Shenzhen City R&D funding for Science and Technologies–Platform Construction Plan for Key Laboratory. Grant Number: CXB201105060067A
- Shenzhen Key Laboratory of Sensor Technology Open Project. Grant Number: SST201203
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