Investigation of the transition phases from amorphous silicon-based multilayers to silicon nanostructures by in situ X-ray diffraction
Version of Record online: 11 MAR 2014
© 2014 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
physica status solidi (a)
Volume 211, Issue 7, pages 1512–1518, July 2014
How to Cite
Agbo, S., Calta, P., Sutta, P., Vavrunkova, V., Netrvalova, M. and Prusakova, L. (2014), Investigation of the transition phases from amorphous silicon-based multilayers to silicon nanostructures by in situ X-ray diffraction. Phys. Status Solidi A, 211: 1512–1518. doi: 10.1002/pssa.201330231
- Issue online: 9 JUL 2014
- Version of Record online: 11 MAR 2014
- Manuscript Accepted: 19 FEB 2014
- Manuscript Revised: 14 NOV 2013
- Manuscript Received: 15 AUG 2013
- EU and Czech Government Sponsorship. Grant Number: EXLIZ-NTC-7
- ERDF. Grant Number: CZ.1.05/2.1.00/03.0088
- Ministry of Education, Youth and Sports
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