physica status solidi (a)

Cover image for Vol. 204 Issue 8

Special Issue: High Resolution X-ray Diffraction and Imaging

August 2007

Volume 204, Issue 8

Pages 2503–2823

  1. Cover Picture

    1. Top of page
    2. Cover Picture
    3. Preface
    4. Obituary
    5. Original Papers
    1. Real-time and in situ solidification of Al-based alloys investigated by synchrotron radiation: a unique experimental set-up combining radiography and topography techniques (page 2503)

      A. Buffet, G. Reinhart, T. Schenk, H. Nguyen-Thi, J. Gastaldi, N. Mangelinck-Noël, H. Jung, J. Härtwig, J. Baruchel and B. Billia

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200790013

  2. Preface

    1. Top of page
    2. Cover Picture
    3. Preface
    4. Obituary
    5. Original Papers
    1. Guest Editors' Introduction: Special issue on high resolution X-ray diffraction and imaging (pages 2509–2513)

      Tilo Baumbach, Daniel Lübbert and Timm Weitkamp

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200790014

  3. Obituary

    1. Top of page
    2. Cover Picture
    3. Preface
    4. Obituary
    5. Original Papers
  4. Original Papers

    1. Top of page
    2. Cover Picture
    3. Preface
    4. Obituary
    5. Original Papers
    1. X-ray scattering

      Determination of stacking fault densities in 3C-SiC crystals by diffuse X-ray scattering (pages 2528–2534)

      A. Boulle, D. Chaussende, F. Pecqueux, F. Conchon, L. Latu-Romain and O. Masson

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675652

    2. Misfit dislocations in highly mismatched oxide interfaces, an X-ray diffraction study (pages 2535–2541)

      F. Conchon, A. Boulle and R. Guinebretière

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675653

    3. Investigation by High Resolution X-ray Diffraction of the local strains induced in Si by periodic arrays of oxide filled trenches (pages 2542–2547)

      M. Eberlein, S. Escoubas, M. Gailhanou, O. Thomas, J.-S. Micha, P. Rohr and R. Coppard

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675654

    4. Synchrotron X-ray Renninger scanning for studying strain in InAs/GaAs quantum dot system (pages 2548–2554)

      Raul O. Freitas, Tomás E. Lamas, Andre A. Quivy and Sérgio L. Morelhão

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675673

    5. High-temperature induced nano-crystal formation in ion beam-induced amorphous silicon ripples (pages 2555–2560)

      J. Grenzer, A. Mücklich, S. Grigorian, U. Pietsch, D. P. Datta, T. K. Chini, S. Hazra and M. K. Sanyal

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675655

    6. X-ray diffraction peaks from misfit dislocations in double- and triple-crystal diffractometry (pages 2561–2566)

      Vladimir M. Kaganer, Artem Shalimov, Jadwiga Bak-Misiuk and Klaus H. Ploog

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675657

    7. Structural anisotropy of InGaAs/GaAs(001) quantum dot chains structures (pages 2567–2571)

      V. P. Kladko, M. V. Slobodian, V. V. Strelchuk, O. M. Yefanov, V. F. Machulin, Yu. I. Mazur, Zh. M. Wang and G. J. Salamo

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675678

    8. Anomalous scattering and isomorphous replacement in X-ray diffuse scattering holography (pages 2572–2577)

      Miloš Kopecký, Jiří Kub, Edoardo Busetto, Andrea Lausi, Jan Fábry and Zbyněk Šourek

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675658

    9. High-resolution X-ray diffraction study of CZ-grown GaAsP crystals (pages 2578–2584)

      G. Kowalski, J. Gronkowski, A. Czyżak, T. Słupiński and J. Borowski

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675660

    10. Evolution of the microdefect structure in silicon on isothermal annealing as determined by X-ray diffractometry (pages 2591–2597)

      Ye. M. Kyslovskyy, T. P. Vladimirova, S. I. Olikhovskii, V. B. Molodkin, E. V. Kochelab and R. F. Seredenko

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675680

    11. High resolution X-ray diffraction analyses of ion-implanted GaN/AlN/Si heterostructures (pages 2598–2605)

      R. J. Matyi, M. Jamil and F. Shahedipour-Sandvik

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675683

    12. Dynamical theory of X-ray diffraction by multilayered structures with microdefects (pages 2606–2612)

      V. B. Molodkin, S. I. Olikhovskii, E. N. Kislovskii, I. M. Fodchuk, E. S. Skakunova, E. V. Pervak and V. V. Molodkin

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675686

    13. Wide angle X-ray dynamical diffraction by deformed crystals: recurrence relations (pages 2613–2619)

      K. M. Pavlov, D. M. Paganin, D. J. Vine and L. Kirste

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675663

    14. Characterization of InP porous layer by high-resolution X-ray diffraction (pages 2620–2625)

      V. I. Punegov, A. A. Lomov and K. D. Shcherbachev

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675689

    15. Grazing incidence X-ray scattering from epitaxial Fe/Au multilayers (pages 2626–2632)

      A. S. H. Rozatian, T. P. A. Hase, B. K. Tanner, P. A. Ryan, D. T. Dekadjevi and B. J. Hickey

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675694

    16. Defect structure of silicon crystals implanted with H2+ ions (pages 2638–2644)

      Artem Shalimov, Kirill D. Shcherbachev, Jadwiga Bak-Misiuk and Andrzej Misiuk

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675697

    17. Radiation-induced structural transformations in a silicon layer of SOI (pages 2645–2650)

      K. D. Shcherbachev, V. T. Bublik, V. N. Mordkovich, D. M. Pazhin, E. Alves and N. P. Barradas

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675698

    18. Combined double- and triple-crystal X-ray diffractometry with account for real defect structures in all crystals of X-ray optical schemes (pages 2651–2656)

      A. P. Shpak, V. B. Molodkin, S. I. Olikhovskii, Ye. M. Kyslovskyy, O. V. Reshetnyk, T. P. Vladimirova, E. G. Len, A. I. Nizkova, V. M. Venger and S. V. Dmitriev

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675700

    19. X-ray characterization of periodic sub-nm surface relief gratings (pages 2657–2661)

      P. Zaumseil, M. Birkholz and G. Weidner

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675705

    20. Oxidation as an assistant tool for structural analysis of inhomogeneous nanoscale InAs/AlAs(001) island system (pages 2662–2668)

      A. Zolotaryov, A. Bolz, A. Schramm, W. Hansen and R. L. Johnson

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675707

    21. X-ray imaging

      White X-ray beam topography and radiography of Si1–xGex crystals bonded to silicon (pages 2669–2674)

      T. S. Argunova, J. M. Yi, J. W. Jung, J. H. Je, L. M. Sorokin, M. Yu. Gutkin, E. I. Belyakova, L. S. Kostina, A. G. Zabrodskii and N. V. Abrosimov

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675667

    22. Determination of stress distribution in III–V single crystal layers for heterogeneous integration applications (pages 2675–2681)

      M. Jackson, M. S. Goorsky, A. Noori, S. Hayashi, R. Sandhu, B. Poust, P. Chang-Chien, A. Gutierrez-Aitken and R. Tsai

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675675

    23. Features of dislocation images reconstructed from step-scanned white X-ray section topographs (pages 2682–2687)

      Kentaro Kajiwara, Seiji Kawado, Satoshi Iida, Yoshifumi Suzuki and Yoshinori Chikaura

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675677

    24. Characterization of dislocations in orthorhombic hen egg-white lysozyme crystals by synchrotron X-ray topography (pages 2688–2693)

      H. Koizumi, M. Shimizu, M. Tachibana and K. Kojima

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675679

    25. Observation of interference fringes due to lattice distortion by resonant scattering X-ray topography (pages 2694–2699)

      Riichirou Negishi, Tomoe Fukamachi, Masami Yoshizawa, Keiichi Hirano and Takaaki Kawamura

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675662

    26. Three-dimensional topography using an X-ray microbeam and novel slit technique (pages 2706–2713)

      R. Tanuma, T. Kubo, F. Togoh, T. Tawara, A. Saito, K. Fukuda, K. Hayashi and Y. Tsusaka

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675703

    27. Structural changes in arsenic ion-implanted Hg1–xCdxTe epitaxial layers (pages 2714–2720)

      I. Fodchuk, R. Zaplitnyy, T. Kazemirskiy and Z. Swiatek

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675704

    28. Real-time and in situ solidification of Al-based alloys investigated by synchrotron radiation: a unique experimental set-up combining radiography and topography techniques (pages 2721–2727)

      A. Buffet, G. Reinhart, T. Schenk, H. Nguyen-Thi, J. Gastaldi, N. Mangelinck-Noël, H. Jung, J. Härtwig, J. Baruchel and B. Billia

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675670

    29. Phase contrast X-ray imaging of large samples using an incoherent laboratory source (pages 2728–2733)

      C. Kottler, F. Pfeiffer, O. Bunk, C. Grünzweig, J. Bruder, R. Kaufmann, L. Tlustos, H. Walt, I. Briod, T. Weitkamp and C. David

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675659

    30. Hydrogen diffusion in titanium-hydride observed by the diffraction-enhanced X-ray imaging method (pages 2734–2739)

      K. Mizuno, Y. Furuya, K. Hirano and H. Okamoto

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675684

    31. Analyzer-based X-ray phase contrast imaging with four bounce Si(444) monochromators at ELETTRA (pages 2740–2745)

      M. G. Hönnicke, L. Rigon, F. Arfelli, R.-H. Menk and C. Cusatis

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675674

    32. Spatial resolution in Bragg-magnified X-ray images as determined by Fourier analysis (pages 2746–2752)

      Peter Modregger, Daniel Lübbert, Peter Schäfer and Rolf Köhler

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675685

    33. X-ray diffraction spot mapping – a tool to study structural properties of semiconductor disk laser devices (pages 2753–2759)

      U. Zeimer, J. Grenzer, D. Korn, S. Döring, M. Zorn, W. Pittroff, U. Pietsch, F. Saas and M. Weyers

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675706

    34. Synchrotron-radiation computed laminography for high-resolution three-dimensional imaging of flat devices (pages 2760–2765)

      Lukas Helfen, Anton Myagotin, Alexander Rack, Petra Pernot, Petr Mikulík, Marco Di Michiel and Tilo Baumbach

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200775676

    35. In-situ characterization during growth and processing

      Thermal evolution of small N–D complexes in deuterated dilute nitrides revealed by in-situ high resolution X-ray diffraction (pages 2766–2771)

      G. Bisognin, D. De Salvador, E. Napolitani, M. Berti, A. Polimeni, M. Felici, M. Capizzi, G. Bais, F. Jabeen, M. Piccin, S. Rubini, F. Martelli and A. Franciosi

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675651

    36. First order phase transition in MnAs nanodisks (pages 2772–2777)

      B. Jenichen, V. M. Kaganer, Y. Takagaki, C. Herrmann, K. H. Ploog, E. Dudzik and R. Feyerherm

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675656

    37. Interface stability of magnetic tunnel barriers and electrodes (pages 2778–2784)

      A. Lamperti, A. T. G. Pym, D. S. Eastwood, S. Cardoso, P. Wisniowski, P. P. Freitas, G. I. R. Anderson, C. H. Marrows and B. K. Tanner

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675682

    38. Real-time X-ray reflectometry during thin-film processing (pages 2785–2791)

      L. Peverini, I. Kozhevnikov and E. Ziegler

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675665

    39. In situ X-ray diffraction during MOCVD of III-nitrides (pages 2798–2803)

      C. Simbrunner, A. Navarro-Quezada, K. Schmidegg, A. Bonanni, A. Kharchenko, J. Bethke, K. Lischka and H. Sitter

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675701

    40. X-ray optics and instrumentation

      Analysis of SR thermal load studied by FEA (pages 2804–2810)

      V. Áč and D. Korytár

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675666

    41. Investigation of phase contrast hard X-ray microscopy using planar sets of refractive crossed linear parabolic lenses made from SU-8 polymer (pages 2811–2816)

      E. Reznikova, T. Weitkamp, V. Nazmov, A. Last, M. Simon and V. Saile

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675690

    42. Focusing high energy X-rays with stacked Fresnel zone plates (pages 2817–2823)

      I. Snigireva, A. Snigirev, V. Kohn, V. Yunkin, M. Grigoriev, S. Kuznetsov, G. Vaughan and M. Di Michiel

      Article first published online: 31 JUL 2007 | DOI: 10.1002/pssa.200675702

SEARCH

SEARCH BY CITATION