physica status solidi (a)

Cover image for Vol. 205 Issue 4

April 2008

Volume 205, Issue 4

Pages 669–988

  1. Cover Picture

    1. Top of page
    2. Cover Picture
    3. Contents
    4. NEW IN pss
    5. Feature Articles
    6. Original Papers
    1. Cover Picture: phys. stat. sol. (a) 205/4

      Article first published online: 4 APR 2008 | DOI: 10.1002/pssa.200890003

  2. Contents

    1. Top of page
    2. Cover Picture
    3. Contents
    4. NEW IN pss
    5. Feature Articles
    6. Original Papers
    1. Contents: phys. stat. sol. (a) 205/4 (pages 669–674)

      Article first published online: 4 APR 2008 | DOI: 10.1002/pssa.200821611

  3. NEW IN pss

    1. Top of page
    2. Cover Picture
    3. Contents
    4. NEW IN pss
    5. Feature Articles
    6. Original Papers
  4. Feature Articles

    1. Top of page
    2. Cover Picture
    3. Contents
    4. NEW IN pss
    5. Feature Articles
    6. Original Papers
    1. Tunneling phenomena in carbon nanotube field-effect transistors (pages 679–694)

      Joachim Knoch and Joerg Appenzeller

      Article first published online: 17 MAR 2008 | DOI: 10.1002/pssa.200723528

    2. Introducing crystalline rare-earth oxides into Si technologies (pages 695–707)

      H. J. Osten, A. Laha, M. Czernohorsky, E. Bugiel, R. Dargis and A. Fissel

      Article first published online: 17 MAR 2008 | DOI: 10.1002/pssa.200723509

  5. Original Papers

    1. Top of page
    2. Cover Picture
    3. Contents
    4. NEW IN pss
    5. Feature Articles
    6. Original Papers
    1. Spectroscopic Ellipsometry (ICSE 4)

      Polarization optics of interfaces and thin films (pages 709–714)

      R. M. A. Azzam

      Article first published online: 20 MAR 2008 | DOI: 10.1002/pssa.200777745

    2. Dielectric function representation by B-splines (pages 715–719)

      Blaine Johs and Jeffrey S. Hale

      Article first published online: 18 MAR 2008 | DOI: 10.1002/pssa.200777754

    3. Depolarizing Mueller matrices: how to decompose them? (pages 720–727)

      R. Ossikovski, M. Anastasiadou, S. Ben Hatit, E. Garcia-Caurel and A. De Martino

      Article first published online: 18 MAR 2008 | DOI: 10.1002/pssa.200777793

    4. The anisotropic bond model of nonlinear optics (pages 728–731)

      E. J. Adles and D. E. Aspnes

      Article first published online: 20 MAR 2008 | DOI: 10.1002/pssa.200777846

    5. The nearly aligned rotating-monoplate compensator (pages 739–742)

      M. Asar and D. E. Aspnes

      Article first published online: 20 MAR 2008 | DOI: 10.1002/pssa.200777871

    6. Angle-resolved Mueller polarimeter using a microscope objective (pages 743–747)

      S. Ben Hatit, M. Foldyna, A. De Martino and B. Drévillon

      Article first published online: 20 MAR 2008 | DOI: 10.1002/pssa.200777806

    7. Precise phase-modulation generalized ellipsometry of anisotropic samples (pages 752–755)

      L. Halagacˇka, K. Postava, M. Foldyna and J. Pištora

      Article first published online: 18 MAR 2008 | DOI: 10.1002/pssa.200777823

    8. Effective dielectric response of nanostructured layers (pages 756–763)

      Herbert Wormeester, E. Stefan Kooij and Bene Poelsema

      Article first published online: 18 MAR 2008 | DOI: 10.1002/pssa.200777740

    9. Imaging ellipsometry: quantitative analysis (pages 764–771)

      L. Asinovski, D. Beaglehole and M. T. Clarkson

      Article first published online: 4 APR 2008 | DOI: 10.1002/pssa.200777855

    10. n and k testing of magnetic heads with imaging spectroscopic ellipsometry (pages 772–778)

      M. Vaupel, Song Yunfeng and Yuan Zhimin

      Article first published online: 20 MAR 2008 | DOI: 10.1002/pssa.200777743

    11. The optical Hall effect (pages 779–783)

      T. Hofmann, C. M. Herzinger, C. Krahmer, K. Streubel and M. Schubert

      Article first published online: 20 MAR 2008 | DOI: 10.1002/pssa.200777904

    12. Immersion scatterometry for improved nano-scale topography measurements (pages 784–788)

      Elson Liu and Fred L. Terry Jr.

      Article first published online: 20 MAR 2008 | DOI: 10.1002/pssa.200777756

    13. Conventional and generalized ellipsometric investigation of isotropic spherical and anisotropic ellipsoidal cobalt nanoparticles (pages 789–792)

      M. Gilliot, A. En Naciri, L. Johann, J. P. Stoquert, J. J. Grob and D. Muller

      Article first published online: 4 APR 2008 | DOI: 10.1002/pssa.200777778

    14. Rayleigh–Mie scattering ellipsometry as an in situ diagnostic for the production of “smart nanoparticles” (pages 802–805)

      Raphaela Weiß, Suk-Ho Hong, Jens Ränsch and Jörg Winter

      Article first published online: 18 MAR 2008 | DOI: 10.1002/pssa.200777803

    15. Monitoring critical dimensions of bidimensional gratings by spectroscopic ellipsometry and Mueller polarimetry (pages 806–809)

      M. Foldyna, A. De Martino, E. Garcia-Caurel, R. Ossikovski, F. Bertin, J. Hazart, K. Postava and B. Drevillon

      Article first published online: 18 MAR 2008 | DOI: 10.1002/pssa.200777808

    16. Enhancement in ellipsometric thin film sensitivity near surface plasmon resonance conditions (pages 817–820)

      H. Arwin, M. Poksinski and K. Johansen

      Article first published online: 20 MAR 2008 | DOI: 10.1002/pssa.200777899

    17. Exploring the thermal transformation of mesoporous titania using spectroscopic ellipsometry (pages 825–828)

      S. Y. Choi, M. Mamak, G. A. Ozin and F. C. Peiris

      Article first published online: 20 MAR 2008 | DOI: 10.1002/pssa.200777878

    18. Optical constants and critical-point parameters of GaAs1–xSbx alloy films grown on GaAs (pages 833–836)

      N. Ben Sedrine, T. Gharbi, J. C. Harmand and R. Chtourou

      Article first published online: 18 MAR 2008 | DOI: 10.1002/pssa.200777746

    19. Optical characterization of rocksalt Pb1–xSnx Te alloys (pages 837–840)

      Nilton Souza Dantas, Hans Arwin, Gabriel Nzulu, Paulo Henrique de Oliveira Rappl, Antônio Ferreira da Silva and Clas Persson

      Article first published online: 20 MAR 2008 | DOI: 10.1002/pssa.200777747

    20. Etching-back of uniaxially strained silicon on insulator investigated by spectroscopic ellipsometry (pages 841–844)

      C. Himcinschi, R. Singh, O. Moutanabbir, R. Scholz, M. Reiche, S. H. Christiansen, U. Gösele and D. R. T. Zahn

      Article first published online: 18 MAR 2008 | DOI: 10.1002/pssa.200777753

    21. Dielectric function and optical transitions of silicon nanocrystals between 0.6 eV and 6.5 eV (pages 845–848)

      M. Mansour, A. En Naciri, L. Johann, J. J. Grob and M. Stchakovsky

      Article first published online: 4 APR 2008 | DOI: 10.1002/pssa.200777762

    22. Lattice absorption of Be-containing semiconductor alloys determined by spectroscopic ellipsometry (pages 849–853)

      A. A. Wronkowska, Ł. Skowroński, A. Wronkowski, Ł. Zieliński, F. Firszt, A. Marasek, W. Paszkowicz and H. Arwin

      Article first published online: 18 MAR 2008 | DOI: 10.1002/pssa.200777774

    23. Spectroscopic ellipsometry and photoluminescence investigation of Zn1–xyBex Mgy Se and Cd1–xyBex Zny Se crystals (pages 854–858)

      A. A. Wronkowska, Ł. Skowroński, A. Wronkowski, F. Firszt, H. Me¸czyńska, S. Łe¸gowski, K. Strzałkowski and H. Arwin

      Article first published online: 18 MAR 2008 | DOI: 10.1002/pssa.200777775

    24. Changes in optical properties of MnAs thin films on GaAs(001) induced by α- to β-phase transition (pages 859–862)

      B. Gallas, J. Rivory, H. Arwin, F. Vidal and V. H. Etgens

      Article first published online: 18 MAR 2008 | DOI: 10.1002/pssa.200777782

    25. Monitoring the α- to β-phase transition in MnAs/GaAs(001) thin films as function of temperature (pages 863–866)

      B. Gallas, J. Rivory, H. Arwin, F. Vidal and M. Stchakovsky

      Article first published online: 18 MAR 2008 | DOI: 10.1002/pssa.200777783

    26. Stress and stress monitoring in SiC–Si heterostructures (pages 867–871)

      Jörg Pezoldt, Richard Nader, Florentina Niebelschütz, Volker Cimalla, Thomas Stauden, Charbel Zgheib and Pierre Masri

      Article first published online: 18 MAR 2008 | DOI: 10.1002/pssa.200777785

    27. Optical functions of AlAsSb characterized by spectroscopic ellipsometry (pages 872–875)

      T. Mozume, M. Tanaka, A. Yoshimi and W. Susaki

      Article first published online: 18 MAR 2008 | DOI: 10.1002/pssa.200777811

    28. Characterization of Si nanorods by spectroscopic ellipsometry with efficient theoretical modeling (pages 876–879)

      Shih-Hsin Hsu, En-Shao Liu, Yia-Chung Chang, James N. Hilfiker, Young Dong Kim, Tae Jung Kim, Chun-Jung Lin and Gong-Ru Lin

      Article first published online: 20 MAR 2008 | DOI: 10.1002/pssa.200777832

    29. Spectroscopic ellipsometry study of Co-doped TiO2 films (pages 880–883)

      H. Águas, N. Popovici, L. Pereira, O. Conde, W. R. Branford, L. F. Cohen, E. Fortunato and R. Martins

      Article first published online: 18 MAR 2008 | DOI: 10.1002/pssa.200777843

    30. Dielectric properties of InAsP alloy thin films and evaluation of direct- and reciprocal-space methods of determining critical-point parameters (pages 884–887)

      S. G. Choi, D. E. Aspnes, N. A. Stoute, Y. D. Kim, H. J. Kim, Y.-C. Chang and C. J. Palmstrøm

      Article first published online: 4 APR 2008 | DOI: 10.1002/pssa.200777848

    31. Ellipsometric measurements of quantum confinement effects on higher interband transitions of Ge nanocrystals (pages 888–891)

      M. I. Alonso, M. Garriga, A. Bernardi, ICREA Research Professor A. R. Goñi, A. F. Lopeandia, G. Garcia, J. Rodríguez-Viejo and J. L. Lábár

      Article first published online: 18 MAR 2008 | DOI: 10.1002/pssa.200777851

    32. Analysis of Si1–xGex:H thin films with graded composition and structure by real time spectroscopic ellipsometry (pages 892–895)

      N. J. Podraza, Jing Li, C. R. Wronski, E. C. Dickey, M. W. Horn and R. W. Collins

      Article first published online: 20 MAR 2008 | DOI: 10.1002/pssa.200777876

    33. Observation of quantum confinement and quantum size effects (pages 896–900)

      A. C. Diebold and J. Price

      Article first published online: 4 APR 2008 | DOI: 10.1002/pssa.200777891

    34. Polaron transitions in charge intercalated amorphous tungsten oxide thin films (pages 914–917)

      M. F. Saenger, T. Höing, T. Hofmann and M. Schubert

      Article first published online: 4 APR 2008 | DOI: 10.1002/pssa.200777894

    35. Observation of interfacial electrostatic field-induced changes in the silicon dielectric function using spectroscopic ellipsometry (pages 918–921)

      J. Price, P. S. Lysaght, S. C. Song, A. C. Diebold, Y. Q. An and M. C. Downer

      Article first published online: 20 MAR 2008 | DOI: 10.1002/pssa.200777836

    36. Spectroscopic ellipsometry study of thin diffusion barriers of TaN and Ta for Cu interconnects in integrated circuits (pages 922–926)

      S. Rudra, T. Wächtler, M. Friedrich, S. J. Louis, C. Himcinschi, S. Zimmermann, S. E. Schulz, S. Silaghi, C. Cobet, N. Esser, T. Gessner and D. R. T. Zahn

      Article first published online: 20 MAR 2008 | DOI: 10.1002/pssa.200777831

    37. Uniaxial anisotropy of organic thin films determined by ellipsometry (pages 927–930)

      U. Heinemeyer, A. Hinderhofer, M. I. Alonso, J. O. Ossó, M. Garriga, M. Kytka, A. Gerlach and F. Schreiber

      Article first published online: 20 MAR 2008 | DOI: 10.1002/pssa.200777765

    38. Error analysis of a simple and accurate optical coherent ellipsometer (pages 931–935)

      Soe-Mie F. Nee, Chih-Jen Yu, Jheng-Syong Wu, Hong-Sheng Huang and Chien Chou

      Article first published online: 20 MAR 2008 | DOI: 10.1002/pssa.200777860

    39. Comparative investigation of Stöber silica Langmuir–Blodgett films as optical model structures (pages 936–940)

      N. Nagy, A. Deák, A. Hámori, Z. Hórvölgyi, M. Fried, P. Petrik and I. Bársony

      Article first published online: 20 MAR 2008 | DOI: 10.1002/pssa.200777850

    40. Correlation between optical properties of MBE films of AlN and morphology of their surface (pages 941–944)

      S. N. Svitasheva, V. G. Mansurov, K. S. Zhuravlev, A. Yu. Nikitin, D. V. Sheglov and B. Pecz

      Article first published online: 18 MAR 2008 | DOI: 10.1002/pssa.200777733

    41. A FEM-based application for numerical calculations of ellipsometric data (pages 945–948)

      H. Wiklund, H. Arwin and K. Järrendahl

      Article first published online: 20 MAR 2008 | DOI: 10.1002/pssa.200777895

    42. Plasma-Based Ion Implantation & Deposition (PBII&D 2007)

      Generation of droplet-free high-power pulsed sputtering (HPPS) glow plasma with several tens of kilowatts (pages 949–952)

      K. Yukimura, R. Mieda, H. Tamagaki and T. Okimoto

      Article first published online: 20 MAR 2008 | DOI: 10.1002/pssa.200778304

    43. Plasma ion implantation to thin polymer foils (pages 953–956)

      X. B. Tian, Y. X. Huang, J. Li, S. Q. Yang, Paul K. Chu and Ricky K. Y. Fu

      Article first published online: 4 APR 2008 | DOI: 10.1002/pssa.200778342

    44. Mass spectrometry at a Ar/SF6/O2 chemically reactive plasma jet (pages 957–960)

      Th. Arnold and A. Schindler

      Article first published online: 20 MAR 2008 | DOI: 10.1002/pssa.200778339

    45. Production of nitrogen-containing carbon plasma using shunting arc discharge for carbon nitride films preparation (pages 971–975)

      K. Takaki, K. Imanishi, T. Murakami, S. Mukaigawa, T. Fujiwara, Y. Suda and K. Yukimura

      Article first published online: 20 MAR 2008 | DOI: 10.1002/pssa.200778341

    46. Silver nanocluster containing diamond like carbon (pages 976–979)

      F. Schwarz, G. Thorwarth, T. Wehlus and B. Stritzker

      Article first published online: 20 MAR 2008 | DOI: 10.1002/pssa.200778327

    47. PIII nitriding of fcc-alloys containing Ni and Cr (pages 980–984)

      Johanna Lutz, Jürgen W. Gerlach and Stephan Mändl

      Article first published online: 20 MAR 2008 | DOI: 10.1002/pssa.200778329

    48. Comparison of surface layers on copper, titanium and tantalum created by methane plasma-based ion implantation (pages 985–988)

      G. Kraft, S. Flege, K. Baba, R. Hatada and W. Ensinger

      Article first published online: 4 APR 2008 | DOI: 10.1002/pssa.200778330

SEARCH

SEARCH BY CITATION