physica status solidi (a)

Cover image for Vol. 208 Issue 11

November 2011

Volume 208, Issue 11

Pages 2489–2711

  1. Cover Picture

    1. Top of page
    2. Cover Picture
    3. Inside Back Cover
    4. Back Cover
    5. Issue Information
    6. Contents
    7. Recent and forthcoming publications in pss
    8. Original Papers
    9. Information for authors
    1. Front Cover: Coherent X-ray nanodiffraction on single GaAs nanowires (Phys. Status Solidi A 11/2011)

      J. Gulden, S. O. Mariager, A. P. Mancuso, O. M. Yefanov, J. Baltser, P. Krogstrup, J. Patommel, M. Burghammer, R. Feidenhans'l and I. A. Vartanyants

      Version of Record online: 29 OCT 2011 | DOI: 10.1002/pssa.201190035

      Thumbnail image of graphical abstract

      Gulden et al. (pp. 2495-2498) performed a coherent diffraction experiment on single GaAs nanowires. For this experiment, the hard X-ray nanobeam scanning X-ray microscope at ID 13 of the European Synchrotron Radiation Facility (ESRF) was used. Diffraction patterns in the vicinity of a Bragg peak were measured locally in a small region of a selected nanowire, and the origin of the different features is explained. The cover image shows a 3D isosurface of the scattered intensity in the vicinity of the Bragg peak in reciprocal space combined of 60 diffraction patterns. With further development of the method, Coherent X-Ray Diffractive Imaging (CXDI) can possibly provide high resolution images of complicated nanowire structures.

  2. Inside Back Cover

    1. Top of page
    2. Cover Picture
    3. Inside Back Cover
    4. Back Cover
    5. Issue Information
    6. Contents
    7. Recent and forthcoming publications in pss
    8. Original Papers
    9. Information for authors
    1. Inside Back Cover: The properties of sol–gel processed indium-doped zinc oxide semiconductor film and its application in organic solar cells (Phys. Status Solidi A 11/2011)

      A. K. K. Kyaw, Y. Wang, D. W. Zhao, Z. H. Huang, X. T. Zeng and X. W. Sun

      Version of Record online: 29 OCT 2011 | DOI: 10.1002/pssa.201190036

      Thumbnail image of graphical abstract

      Kyaw et al. (pp. 2635-2642) fabricated indium-doped zinc oxide (IZO) semiconductor films by a sol-gel process and studied the influence of doping concentration and relative humidity on the properties of these films. Furthermore, the IZO films were demonstrated as buffer layer in inverted organic solar cells to exclusively collect electrons from the bulk heterojunction. The resistivity of a buffer layer must not be too high or low: with a high-resistivity buffer (e.g. undoped sol-gel ZnO), the efficiency of the solar cell is lowered; and if the resistivity of the buffer is too low, it will cause short-circuit to the solar cell. The image on the right shows an atomic force microscopy (AFM) image of IZO film while the left one illustrates the device architecture and current-voltage characteristics of the cells with and without buffer layers.

  3. Back Cover

    1. Top of page
    2. Cover Picture
    3. Inside Back Cover
    4. Back Cover
    5. Issue Information
    6. Contents
    7. Recent and forthcoming publications in pss
    8. Original Papers
    9. Information for authors
    1. Back Cover: Numerical analysis of superparamagnetic clusters distribution (Phys. Status Solidi A 11/2011)

      A. Chrobak, G. Haneczok, G. Chełkowska, A. Kassiba and G. Ziółkowski

      Version of Record online: 29 OCT 2011 | DOI: 10.1002/pssa.201190037

      Thumbnail image of graphical abstract

      Modern magnetic materials containing nanosized objects can exhibit superparamagnetic behaviour. From the measured magnetic isotherms one can calculate a distribution of the magnetic moment of superparamagnetic clusters which is the main goal of the so-called Langevin granulometry. The cover image presents a result of such analysis obtained by making use of different calculation procedures developed in the article by Chrobak et al. (pp. 2692-2698). The problem is how to determine the cluster distribution consisting of several hundreds of channels based on a magnetic isotherm with only a few dozen points. The apparent lack of information can be supplemented by a physical model as well as a proper calculation procedure. The so-called simulated annealing procedure with additional local maximum entropy condition gives physical reliable results. The image shows the efficiency of the tested algorithms which were applied to the reconstruction of a known cluster distribution. In the background the used algorithm in Pascal style pseudocode is displayed.

  4. Issue Information

    1. Top of page
    2. Cover Picture
    3. Inside Back Cover
    4. Back Cover
    5. Issue Information
    6. Contents
    7. Recent and forthcoming publications in pss
    8. Original Papers
    9. Information for authors
    1. Issue Information

      Version of Record online: 29 OCT 2011 | DOI: 10.1002/pssa.201190038

  5. Contents

    1. Top of page
    2. Cover Picture
    3. Inside Back Cover
    4. Back Cover
    5. Issue Information
    6. Contents
    7. Recent and forthcoming publications in pss
    8. Original Papers
    9. Information for authors
  6. Recent and forthcoming publications in pss

    1. Top of page
    2. Cover Picture
    3. Inside Back Cover
    4. Back Cover
    5. Issue Information
    6. Contents
    7. Recent and forthcoming publications in pss
    8. Original Papers
    9. Information for authors
    1. Recent and forthcoming publications in pss (page 2494)

      Version of Record online: 29 OCT 2011 | DOI: 10.1002/pssa.201121837

  7. Original Papers

    1. Top of page
    2. Cover Picture
    3. Inside Back Cover
    4. Back Cover
    5. Issue Information
    6. Contents
    7. Recent and forthcoming publications in pss
    8. Original Papers
    9. Information for authors
    1. Coherent diffraction and imaging

      Coherent X-ray nanodiffraction on single GaAs nanowires (pages 2495–2498)

      J. Gulden, S. O. Mariager, A. P. Mancuso, O. M. Yefanov, J. Baltser, P. Krogstrup, J. Patommel, M. Burghammer, R. Feidenhans'l and I. A. Vartanyants

      Version of Record online: 18 OCT 2011 | DOI: 10.1002/pssa.201184261

    2. Real-time X-ray diffraction imaging for semiconductor wafer metrology and high temperature in situ experiments (pages 2499–2504)

      A. N. Danilewsky, J. Wittge, A. Hess, A. Cröll, A. Rack, D. Allen, P. McNally, T. dos Santos Rolo, P. Vagovič, T. Baumbach, J. Garagorri, M. R. Elizalde and B. K. Tanner

      Version of Record online: 4 OCT 2011 | DOI: 10.1002/pssa.201184264

    3. Coherent imaging at the Diamond beamline I13 (pages 2522–2525)

      Christoph Rau, Ulrich Wagner, Zoran Pešić and Alberto De Fanis

      Version of Record online: 26 OCT 2011 | DOI: 10.1002/pssa.201184272

    4. High resolution X-ray diffraction

    5. Lattice tilt, concentration, and relaxation degree of partly relaxed InGaAs/GaAs structures (pages 2539–2543)

      A. Benediktovitch, F. Rinaldi, S. Menzel, K. Saito, T. Ulyanenkova, T. Baumbach, I. D. Feranchuk and A. Ulyanenkov

      Version of Record online: 5 OCT 2011 | DOI: 10.1002/pssa.201184251

    6. X-ray diffraction characterization of microdefects in silicon crystals after high-energy electron irradiation (pages 2552–2557)

      V. B. Molodkin, S. I. Olikhovskii, E. G. Len, B. V. Sheludchenko, S. V. Lizunova, Ye. M. Kyslovs'kyy, T. P. Vladimirova, E. V. Kochelab, O. V. Reshetnyk, V. V. Dovganyuk, I. M. Fodchuk, T. V. Lytvynchuk, V. P. Klad'ko and Z. Świątek

      Version of Record online: 11 OCT 2011 | DOI: 10.1002/pssa.201184253

    7. Dynamical X-ray diffractometry of the defect structure of garnet crystals (pages 2558–2562)

      V. M. Pylypiv, T. P. Vladimirova, I. M. Fodchuk, B. K. Ostafiychuk, Ye. M. Kyslovskyy, V. B. Molodkin, S. I. Olikhovskii, O. V. Reshetnyk, O. S. Skakunova, V. V. Lizunov and O. Z. Garpul'

      Version of Record online: 14 OCT 2011 | DOI: 10.1002/pssa.201184254

    8. Phase determination of crystal structure factor using measured rocking curves (pages 2567–2570)

      Riichirou Negishi, Tomoe Fukamachi, Masami Yoshizawa, Kenji Hirano, Keiichi Hirano and Takaaki Kawamura

      Version of Record online: 14 OCT 2011 | DOI: 10.1002/pssa.201184257

    9. High-resolution reciprocal space mapping of distributed Bragg reflectors and virtual substrates (pages 2582–2586)

      A. Zhylik, F. Rinaldi, M. Myronov, K. Saito, S. Menzel, A. Dobbie, D. R. Leadley, T. Ulyanenkova, I. D. Feranchuk and A. Ulyanenkov

      Version of Record online: 14 OCT 2011 | DOI: 10.1002/pssa.201184260

    10. Study of oxide precipitates in silicon using X-ray diffraction techniques (pages 2587–2590)

      Ondřej Caha, Silvie Bernatová, Mojmír Meduňa, Milan Svoboda and Jiří Buršík

      Version of Record online: 5 OCT 2011 | DOI: 10.1002/pssa.201184263

    11. Reflectivity and grazing incidence diffraction

      Determination of the density of ultrathin La films in La/B4C layered structures using X-ray standing waves (pages 2597–2600)

      I. A. Makhotkin, E. Louis, R. W. E. van de Kruijs, A. E. Yakshin, E. Zoethout, A. Yu. Seregin, E. Yu. Tereschenko, S. N. Yakunin and F. Bijkerk

      Version of Record online: 5 OCT 2011 | DOI: 10.1002/pssa.201184256

    12. Applications of an energy-dispersive pnCCD for X-ray reflectivity: Investigation of interdiffusion in Fe–Pt multilayers (pages 2601–2607)

      Ali Abboud, Sebastian Send, Robert Hartmann, Lothar Strüder, Alan Savan, Alfred Ludwig, Nikolay Zotov and Ullrich Pietsch

      Version of Record online: 18 OCT 2011 | DOI: 10.1002/pssa.201184268

    13. Tuning the shape and damage in ion-beam induced ripples on silicon (pages 2608–2611)

      Andreas Biermanns, Antje Hanisch, Jörg Grenzer, Till Hartmut Metzger and Ullrich Pietsch

      Version of Record online: 14 OCT 2011 | DOI: 10.1002/pssa.201184269

    14. Investigation of surface and sub-surface damage in high quality synthetic diamonds by X-ray reflectivity and grazing incidence in-plane diffraction (pages 2612–2618)

      Genziana Bussone, Tamzin A. Lafford, Fabio Masiello, Alain Gibaud, Gerardina Carbone, Tobias U. Schülli, Simon H. Connell, Amparo Vivo Rommeveaux, Matthew Wormington and Jürgen Härtwig

      Version of Record online: 11 OCT 2011 | DOI: 10.1002/pssa.201184270

    15. GISAXS and AFM study of self-assembled Fe2O3 nanoparticles and Si nanodots (pages 2619–2622)

      A. Ulyanenkov, J. Chrost, P. Siffalovic, L. Chitu, E. Majkova, K. Erlacher, H. Guerault, G. Maier, M. Cornejo, B. Ziberi and F. Frost

      Version of Record online: 18 OCT 2011 | DOI: 10.1002/pssa.201184273

    16. Study of roughness in multilayer Mo–Si mirrors (pages 2623–2628)

      G. A. Valkovskiy, M. V. Baidakova, P. N. Brunkov, S. G. Konnikov, M. A. Yagovkina and Ju. M. Zadiranov

      Version of Record online: 4 OCT 2011 | DOI: 10.1002/pssa.201184274

    17. In situ GISAXS monitoring of Langmuir nanoparticle multilayer degradation processes induced by UV photolysis (pages 2629–2634)

      Karol Vegso, Peter Siffalovic, Martin Weis, Matej Jergel, Monika Benkovicova, Eva Majkova, Livia Chitu, Yuryi Halahovets, Stefan Luby, Ignac Capek and Alexander Satka

      Version of Record online: 10 OCT 2011 | DOI: 10.1002/pssa.201184275

    18. Materials preparation, manipulation, and structure

    19. Nanostructures, thin films, surfaces and interfaces

      Al catalyzed growth of silicon nanowires and subsequent in situ dry etching of the catalyst for photovoltaic application (pages 2676–2680)

      David Kohen, Vasiliki Tileli, Cyril Cayron, Pascal Faucherand, Christine Morin, Joël Dufourcq, Sébastien Noël, Michel Levis, Arnaud Brioude and Simon Perraud

      Version of Record online: 11 JUL 2011 | DOI: 10.1002/pssa.201127072

    20. Optical properties

    21. Magnetic properties; magnetic resonances

      Numerical analysis of superparamagnetic clusters distribution (pages 2692–2698)

      A. Chrobak, G. Haneczok, G. Chełkowska, A. Kassiba and G. Ziółkowski

      Version of Record online: 7 JUL 2011 | DOI: 10.1002/pssa.201127016

    22. Dielectric and ferroelectric properties

      Doping and grain size effects on pyroelectric properties of Ba0.7Sr0.3TiO3 for uncooled infrared bolometer (pages 2699–2708)

      Guangzu Zhang, Shenglin Jiang, Yike Zeng, Yangyang Zhang, Qingfeng Zhang, Yan Yu and Jing Wang

      Version of Record online: 7 JUL 2011 | DOI: 10.1002/pssa.201127226

  8. Information for authors

    1. Top of page
    2. Cover Picture
    3. Inside Back Cover
    4. Back Cover
    5. Issue Information
    6. Contents
    7. Recent and forthcoming publications in pss
    8. Original Papers
    9. Information for authors
    1. Information for authors (pages 2710–2711)

      Version of Record online: 29 OCT 2011 | DOI: 10.1002/pssa.201121839

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