physica status solidi (a)

Cover image for physica status solidi (a)

16 January 1987

Volume 99, Issue 1

Pages fmi–fmi, 9–320, K1–K68

Currently known as: physica status solidi (a)

  1. Masthead

    1. Top of page
    2. Masthead
    3. International Classification System for Physics
    4. Substance Classification
    5. Review Article
    6. Structure; Crystallography
    7. Defects; Nonelectronic Transppport
    8. Lattice Properties
    9. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    10. Localized Electronic States
    11. Electronic Transport; Superconductivity
    12. Magnetiic Properties; Resonances
    13. Dielectric and Optical Properties
    14. Device-Related Phenomena
    15. Structure; Crystallography
    16. Defects; Nonelectronic Transppport
    17. Lattice Properties
    18. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    19. Localized Electronic States
    20. Magnetiic Properties; Resonances
    21. Device-Related Phenomena
    1. Masthead (page fmi)

      Version of Record online: 15 FEB 2006 | DOI: 10.1002/pssa.2210990101

  2. International Classification System for Physics

    1. Top of page
    2. Masthead
    3. International Classification System for Physics
    4. Substance Classification
    5. Review Article
    6. Structure; Crystallography
    7. Defects; Nonelectronic Transppport
    8. Lattice Properties
    9. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    10. Localized Electronic States
    11. Electronic Transport; Superconductivity
    12. Magnetiic Properties; Resonances
    13. Dielectric and Optical Properties
    14. Device-Related Phenomena
    15. Structure; Crystallography
    16. Defects; Nonelectronic Transppport
    17. Lattice Properties
    18. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    19. Localized Electronic States
    20. Magnetiic Properties; Resonances
    21. Device-Related Phenomena
  3. Substance Classification

    1. Top of page
    2. Masthead
    3. International Classification System for Physics
    4. Substance Classification
    5. Review Article
    6. Structure; Crystallography
    7. Defects; Nonelectronic Transppport
    8. Lattice Properties
    9. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    10. Localized Electronic States
    11. Electronic Transport; Superconductivity
    12. Magnetiic Properties; Resonances
    13. Dielectric and Optical Properties
    14. Device-Related Phenomena
    15. Structure; Crystallography
    16. Defects; Nonelectronic Transppport
    17. Lattice Properties
    18. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    19. Localized Electronic States
    20. Magnetiic Properties; Resonances
    21. Device-Related Phenomena
    1. Substance classification (page 14)

      Version of Record online: 15 FEB 2006 | DOI: 10.1002/pssa.2210990103

  4. Review Article

    1. Top of page
    2. Masthead
    3. International Classification System for Physics
    4. Substance Classification
    5. Review Article
    6. Structure; Crystallography
    7. Defects; Nonelectronic Transppport
    8. Lattice Properties
    9. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    10. Localized Electronic States
    11. Electronic Transport; Superconductivity
    12. Magnetiic Properties; Resonances
    13. Dielectric and Optical Properties
    14. Device-Related Phenomena
    15. Structure; Crystallography
    16. Defects; Nonelectronic Transppport
    17. Lattice Properties
    18. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    19. Localized Electronic States
    20. Magnetiic Properties; Resonances
    21. Device-Related Phenomena
  5. Structure; Crystallography

    1. Top of page
    2. Masthead
    3. International Classification System for Physics
    4. Substance Classification
    5. Review Article
    6. Structure; Crystallography
    7. Defects; Nonelectronic Transppport
    8. Lattice Properties
    9. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    10. Localized Electronic States
    11. Electronic Transport; Superconductivity
    12. Magnetiic Properties; Resonances
    13. Dielectric and Optical Properties
    14. Device-Related Phenomena
    15. Structure; Crystallography
    16. Defects; Nonelectronic Transppport
    17. Lattice Properties
    18. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    19. Localized Electronic States
    20. Magnetiic Properties; Resonances
    21. Device-Related Phenomena
    1. The influence of the electron subsystem and kinetic factors on the formation of one-dimensionally disordered structures with long-range correlation (pages 81–90)

      A. I. Ustinov, A. Yu. Gaevskii, A. D. Rood, V. S. Skorodzievskii and K. V. Chuistov

      Version of Record online: 15 FEB 2006 | DOI: 10.1002/pssa.2210990110

  6. Defects; Nonelectronic Transppport

    1. Top of page
    2. Masthead
    3. International Classification System for Physics
    4. Substance Classification
    5. Review Article
    6. Structure; Crystallography
    7. Defects; Nonelectronic Transppport
    8. Lattice Properties
    9. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    10. Localized Electronic States
    11. Electronic Transport; Superconductivity
    12. Magnetiic Properties; Resonances
    13. Dielectric and Optical Properties
    14. Device-Related Phenomena
    15. Structure; Crystallography
    16. Defects; Nonelectronic Transppport
    17. Lattice Properties
    18. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    19. Localized Electronic States
    20. Magnetiic Properties; Resonances
    21. Device-Related Phenomena
    1. Transport properties of a cationic superionic conductor (pages 91–95)

      M. Saleem, M. Kadri and R. C. Agrawal

      Version of Record online: 15 FEB 2006 | DOI: 10.1002/pssa.2210990111

  7. Lattice Properties

    1. Top of page
    2. Masthead
    3. International Classification System for Physics
    4. Substance Classification
    5. Review Article
    6. Structure; Crystallography
    7. Defects; Nonelectronic Transppport
    8. Lattice Properties
    9. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    10. Localized Electronic States
    11. Electronic Transport; Superconductivity
    12. Magnetiic Properties; Resonances
    13. Dielectric and Optical Properties
    14. Device-Related Phenomena
    15. Structure; Crystallography
    16. Defects; Nonelectronic Transppport
    17. Lattice Properties
    18. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    19. Localized Electronic States
    20. Magnetiic Properties; Resonances
    21. Device-Related Phenomena
    1. Thermal hysteresis in isomorphic divalent ionic nitrates Ba(NO3)2, Pb(NO3)2, and Sr(NO3)2 (pages 105–113)

      F. El-Kabbany, G. Said, S. Mahrous and N. H. Taher

      Version of Record online: 15 FEB 2006 | DOI: 10.1002/pssa.2210990113

    2. Structural changes of (NH4)2SO4 crystals (pages 131–140)

      S. Ahmed, A. M. Shamah, R. Kamel and Y. Badr

      Version of Record online: 15 FEB 2006 | DOI: 10.1002/pssa.2210990116

  8. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems

    1. Top of page
    2. Masthead
    3. International Classification System for Physics
    4. Substance Classification
    5. Review Article
    6. Structure; Crystallography
    7. Defects; Nonelectronic Transppport
    8. Lattice Properties
    9. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    10. Localized Electronic States
    11. Electronic Transport; Superconductivity
    12. Magnetiic Properties; Resonances
    13. Dielectric and Optical Properties
    14. Device-Related Phenomena
    15. Structure; Crystallography
    16. Defects; Nonelectronic Transppport
    17. Lattice Properties
    18. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    19. Localized Electronic States
    20. Magnetiic Properties; Resonances
    21. Device-Related Phenomena
    1. Scattering of charge carriers in reactively sputtered CdIn2O4 thin films (pages 141–149)

      K. Zakrzewska, T. Pisarkiewicz and A. Czapla

      Version of Record online: 15 FEB 2006 | DOI: 10.1002/pssa.2210990117

    2. Mechanical stresses on the Si[BOND]SiO2 interface (pages 151–158)

      V. I. Sokolov and N. A. Fedorovich

      Version of Record online: 15 FEB 2006 | DOI: 10.1002/pssa.2210990118

    3. Persistent photoconductivity in a-Si:H/a-Si1−xCx:H multilayers (pages 165–170)

      Zhang Fangqing, Xu Xixiang and Chen Guanghua

      Version of Record online: 15 FEB 2006 | DOI: 10.1002/pssa.2210990120

    4. Surface photovoltage spectroscopy of real 〈111〉 GaP surfaces (pages 171–179)

      M. S. El-Dessouki, V. A. Attia, M. M. Saad El-Deen and F. Z. Gobrial

      Version of Record online: 15 FEB 2006 | DOI: 10.1002/pssa.2210990121

    5. The influence of quantum effects on the semiconductor lf- and hf-capacitance (pages 193–204)

      J.-P. Zöllner, G. Paasch and H. Übensee

      Version of Record online: 15 FEB 2006 | DOI: 10.1002/pssa.2210990123

  9. Localized Electronic States

    1. Top of page
    2. Masthead
    3. International Classification System for Physics
    4. Substance Classification
    5. Review Article
    6. Structure; Crystallography
    7. Defects; Nonelectronic Transppport
    8. Lattice Properties
    9. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    10. Localized Electronic States
    11. Electronic Transport; Superconductivity
    12. Magnetiic Properties; Resonances
    13. Dielectric and Optical Properties
    14. Device-Related Phenomena
    15. Structure; Crystallography
    16. Defects; Nonelectronic Transppport
    17. Lattice Properties
    18. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    19. Localized Electronic States
    20. Magnetiic Properties; Resonances
    21. Device-Related Phenomena
    1. The study of impurity levels in LEC semi-insulating GaAs:Cr samples by two-source photoconductivity measurements (pages 225–235)

      J. Pastrňák, F. Karel, J. Oswald, W. Ulrici and N. M. Kolchanova

      Version of Record online: 15 FEB 2006 | DOI: 10.1002/pssa.2210990126

  10. Electronic Transport; Superconductivity

    1. Top of page
    2. Masthead
    3. International Classification System for Physics
    4. Substance Classification
    5. Review Article
    6. Structure; Crystallography
    7. Defects; Nonelectronic Transppport
    8. Lattice Properties
    9. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    10. Localized Electronic States
    11. Electronic Transport; Superconductivity
    12. Magnetiic Properties; Resonances
    13. Dielectric and Optical Properties
    14. Device-Related Phenomena
    15. Structure; Crystallography
    16. Defects; Nonelectronic Transppport
    17. Lattice Properties
    18. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    19. Localized Electronic States
    20. Magnetiic Properties; Resonances
    21. Device-Related Phenomena
    1. Transport properties of monocrystalline silver telluride (pages 237–242)

      P. P. Petrov, V. Vassilev and Z. Boncheva-Mladenova

      Version of Record online: 15 FEB 2006 | DOI: 10.1002/pssa.2210990127

    2. Temperature dependence of the electrical resistivity in [Co1−x(Fe0.5Ni0.5)x] 75Si15B10 metallic glasses (pages 243–249)

      J. M. Barandiarán, J. C. Gómez-Sal, J. Rodríguez Fernández, R. J. López Sánchez and O. V. Nielsen

      Version of Record online: 17 FEB 2006 | DOI: 10.1002/pssa.2210990128

  11. Magnetiic Properties; Resonances

    1. Top of page
    2. Masthead
    3. International Classification System for Physics
    4. Substance Classification
    5. Review Article
    6. Structure; Crystallography
    7. Defects; Nonelectronic Transppport
    8. Lattice Properties
    9. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    10. Localized Electronic States
    11. Electronic Transport; Superconductivity
    12. Magnetiic Properties; Resonances
    13. Dielectric and Optical Properties
    14. Device-Related Phenomena
    15. Structure; Crystallography
    16. Defects; Nonelectronic Transppport
    17. Lattice Properties
    18. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    19. Localized Electronic States
    20. Magnetiic Properties; Resonances
    21. Device-Related Phenomena
  12. Dielectric and Optical Properties

    1. Top of page
    2. Masthead
    3. International Classification System for Physics
    4. Substance Classification
    5. Review Article
    6. Structure; Crystallography
    7. Defects; Nonelectronic Transppport
    8. Lattice Properties
    9. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    10. Localized Electronic States
    11. Electronic Transport; Superconductivity
    12. Magnetiic Properties; Resonances
    13. Dielectric and Optical Properties
    14. Device-Related Phenomena
    15. Structure; Crystallography
    16. Defects; Nonelectronic Transppport
    17. Lattice Properties
    18. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    19. Localized Electronic States
    20. Magnetiic Properties; Resonances
    21. Device-Related Phenomena
    1. Radiative recombination in Zn[BOND]N-doped GaAs1−xPx: N mixed crystals (pages 289–294)

      R. Stelgmann, W. N. Rasbegaev and A. N. Pikhtin

      Version of Record online: 16 FEB 2006 | DOI: 10.1002/pssa.2210990134

  13. Device-Related Phenomena

    1. Top of page
    2. Masthead
    3. International Classification System for Physics
    4. Substance Classification
    5. Review Article
    6. Structure; Crystallography
    7. Defects; Nonelectronic Transppport
    8. Lattice Properties
    9. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    10. Localized Electronic States
    11. Electronic Transport; Superconductivity
    12. Magnetiic Properties; Resonances
    13. Dielectric and Optical Properties
    14. Device-Related Phenomena
    15. Structure; Crystallography
    16. Defects; Nonelectronic Transppport
    17. Lattice Properties
    18. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    19. Localized Electronic States
    20. Magnetiic Properties; Resonances
    21. Device-Related Phenomena
    1. Switching characteristics of MISS devices containing electron surface traps (pages 309–314)

      H. K. Phan, L. H. Phu and N. T. Nguyet Anh

      Version of Record online: 16 FEB 2006 | DOI: 10.1002/pssa.2210990137

    2. On the determination of quantum yield in InGaAsp double-heterostructure LED (pages 315–320)

      B. Rheinländer, J. Kováč, P. Nevermann and H. Fieseler

      Version of Record online: 16 FEB 2006 | DOI: 10.1002/pssa.2210990138

  14. Structure; Crystallography

    1. Top of page
    2. Masthead
    3. International Classification System for Physics
    4. Substance Classification
    5. Review Article
    6. Structure; Crystallography
    7. Defects; Nonelectronic Transppport
    8. Lattice Properties
    9. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    10. Localized Electronic States
    11. Electronic Transport; Superconductivity
    12. Magnetiic Properties; Resonances
    13. Dielectric and Optical Properties
    14. Device-Related Phenomena
    15. Structure; Crystallography
    16. Defects; Nonelectronic Transppport
    17. Lattice Properties
    18. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    19. Localized Electronic States
    20. Magnetiic Properties; Resonances
    21. Device-Related Phenomena
  15. Defects; Nonelectronic Transppport

    1. Top of page
    2. Masthead
    3. International Classification System for Physics
    4. Substance Classification
    5. Review Article
    6. Structure; Crystallography
    7. Defects; Nonelectronic Transppport
    8. Lattice Properties
    9. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    10. Localized Electronic States
    11. Electronic Transport; Superconductivity
    12. Magnetiic Properties; Resonances
    13. Dielectric and Optical Properties
    14. Device-Related Phenomena
    15. Structure; Crystallography
    16. Defects; Nonelectronic Transppport
    17. Lattice Properties
    18. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    19. Localized Electronic States
    20. Magnetiic Properties; Resonances
    21. Device-Related Phenomena
    1. Thermal fixing of volume phase holograms in LiNbO3:Cu (pages K15–K18)

      R. Sommerfeldt, R. A. Rupp, H. Vormann and E. Krätzig

      Version of Record online: 17 FEB 2006 | DOI: 10.1002/pssa.2210990142

  16. Lattice Properties

    1. Top of page
    2. Masthead
    3. International Classification System for Physics
    4. Substance Classification
    5. Review Article
    6. Structure; Crystallography
    7. Defects; Nonelectronic Transppport
    8. Lattice Properties
    9. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    10. Localized Electronic States
    11. Electronic Transport; Superconductivity
    12. Magnetiic Properties; Resonances
    13. Dielectric and Optical Properties
    14. Device-Related Phenomena
    15. Structure; Crystallography
    16. Defects; Nonelectronic Transppport
    17. Lattice Properties
    18. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    19. Localized Electronic States
    20. Magnetiic Properties; Resonances
    21. Device-Related Phenomena
    1. On the melting law at high pressures (pages K23–K26)

      M. Kumari, K. Kumari and N. Dass

      Version of Record online: 16 FEB 2006 | DOI: 10.1002/pssa.2210990144

  17. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems

    1. Top of page
    2. Masthead
    3. International Classification System for Physics
    4. Substance Classification
    5. Review Article
    6. Structure; Crystallography
    7. Defects; Nonelectronic Transppport
    8. Lattice Properties
    9. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    10. Localized Electronic States
    11. Electronic Transport; Superconductivity
    12. Magnetiic Properties; Resonances
    13. Dielectric and Optical Properties
    14. Device-Related Phenomena
    15. Structure; Crystallography
    16. Defects; Nonelectronic Transppport
    17. Lattice Properties
    18. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    19. Localized Electronic States
    20. Magnetiic Properties; Resonances
    21. Device-Related Phenomena
  18. Localized Electronic States

    1. Top of page
    2. Masthead
    3. International Classification System for Physics
    4. Substance Classification
    5. Review Article
    6. Structure; Crystallography
    7. Defects; Nonelectronic Transppport
    8. Lattice Properties
    9. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    10. Localized Electronic States
    11. Electronic Transport; Superconductivity
    12. Magnetiic Properties; Resonances
    13. Dielectric and Optical Properties
    14. Device-Related Phenomena
    15. Structure; Crystallography
    16. Defects; Nonelectronic Transppport
    17. Lattice Properties
    18. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    19. Localized Electronic States
    20. Magnetiic Properties; Resonances
    21. Device-Related Phenomena
    1. Impurity states of chromium in lead telluride (pages K53–K56)

      V. D. Vulchev and L. D. Borisova

      Version of Record online: 16 FEB 2006 | DOI: 10.1002/pssa.2210990151

  19. Magnetiic Properties; Resonances

    1. Top of page
    2. Masthead
    3. International Classification System for Physics
    4. Substance Classification
    5. Review Article
    6. Structure; Crystallography
    7. Defects; Nonelectronic Transppport
    8. Lattice Properties
    9. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    10. Localized Electronic States
    11. Electronic Transport; Superconductivity
    12. Magnetiic Properties; Resonances
    13. Dielectric and Optical Properties
    14. Device-Related Phenomena
    15. Structure; Crystallography
    16. Defects; Nonelectronic Transppport
    17. Lattice Properties
    18. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    19. Localized Electronic States
    20. Magnetiic Properties; Resonances
    21. Device-Related Phenomena
    1. The dip in magnetization curves of sintered Nd-Fe-B permanent magnets (pages K61–K64)

      K.-H. Müller, A. Handstein, D. Eckert and J. Schneider

      Version of Record online: 16 FEB 2006 | DOI: 10.1002/pssa.2210990153

  20. Device-Related Phenomena

    1. Top of page
    2. Masthead
    3. International Classification System for Physics
    4. Substance Classification
    5. Review Article
    6. Structure; Crystallography
    7. Defects; Nonelectronic Transppport
    8. Lattice Properties
    9. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    10. Localized Electronic States
    11. Electronic Transport; Superconductivity
    12. Magnetiic Properties; Resonances
    13. Dielectric and Optical Properties
    14. Device-Related Phenomena
    15. Structure; Crystallography
    16. Defects; Nonelectronic Transppport
    17. Lattice Properties
    18. Surfaces; Interfaces, Thin Films; Lower-Dimensional Systems
    19. Localized Electronic States
    20. Magnetiic Properties; Resonances
    21. Device-Related Phenomena
    1. An inadvertent mid-gap electron level in liquid-phase-epitaxial gap (pages K65–K68)

      M. Zafar Iqbal, A. Jabbar, N. Baber and N. Zafar

      Version of Record online: 16 FEB 2006 | DOI: 10.1002/pssa.2210990154

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