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Ordering in undoped hexagonal AlxGa1–xN grown on sapphire (0001) with 0.09 < x < 0.247
Article first published online: 26 MAR 2003
DOI: 10.1002/pssb.200301760
© 2003 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
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How to Cite
Laügt, M., Bellet-Amalric, E., Ruterana, P. and Omnès, F. (2003), Ordering in undoped hexagonal AlxGa1–xN grown on sapphire (0001) with 0.09 < x < 0.247. physica status solidi (b), 236: 729–739. doi: 10.1002/pssb.200301760
Publication History
- Issue published online: 26 MAR 2003
- Article first published online: 26 MAR 2003
- Manuscript Accepted: 27 JAN 2003
- Manuscript Revised: 18 JAN 2003
- Manuscript Received: 18 OCT 2002
- Abstract
- References
- Cited By
Keywords:
- 61.10.Kw;
- 61.66.Fn;
- 68.37.Lp;
- 81.15.Gh
Abstract
Multiple ordering has been observed both by high resolution X-ray diffraction (HRXRD) and transmission electron microscopy (TEM) in AlxGa1–xN grown by low pressure metal-organic vapor phase epitaxy (LP-MOVPE) on sapphire (0001) with x varying from 9 to 25 percent. This is shown to take place even simultaneously in the same sample; beside the disordered alloy, AlGaN2 (1:1), and Al0.25Ga0.75N (3:1), there is an additional type which a quite large unit cell. In the latter, the c parameter is six times larger than that of the disordered alloy. Through the analysis of X-ray diffraction data and comparison with TEM observations, a structure model is proposed. Taking into account the super-lattice reflections intensity and symmetry, we conclude that this ordered phase contains two consecutive AlN monolayers in the 3.1 nm unit cell that corresponds to Al0.16Ga0.84N (10:2).

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