PAMBE growth and in-situ characterisation of clean (2 × 2) and (√3 × √3) R30° reconstructed InN(0001) thin films

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Abstract

The surface properties of thin InN(0001) films grown by plasma assisted molecular beam epitaxy (PAMBE) were characterised. Two stable surface reconstructions (a (2 × 2) and a (√3 × √3) R30°) are identified which develop depending on the used preparation conditions. The structural, compositional and electronic surface properties were analysed in-situ using reflection high energy electron diffraction (RHEED) and photoelectron spectroscopy (PES). From the absence of surface contaminants as well as excess indium it can be concluded that these superstructures are formed by single adatom layers. (© 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)

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