Dedicated to Thomas Frauenheim on the occasion of his 60th birthday
Identification of defects at the interface between 3C-SiC quantum dots and a SiO2 embedding matrix
Article first published online: 23 DEC 2011
Copyright © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
physica status solidi (b)
Volume 249, Issue 2, pages 360–367, February 2012
How to Cite
Vörös, M., Gali, A., Kaxiras, E., Frauenheim, T. and Knaup, J. M. (2012), Identification of defects at the interface between 3C-SiC quantum dots and a SiO2 embedding matrix. Phys. Status Solidi B, 249: 360–367. doi: 10.1002/pssb.201100527
- Issue published online: 19 JAN 2012
- Article first published online: 23 DEC 2011
- Manuscript Revised: 14 OCT 2011
- Manuscript Accepted: 14 OCT 2011
- Manuscript Received: 31 AUG 2011
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