Determination of MBE grown wurtzite GaN/Ge3N4/Ge heterojunctions band offset by X-ray photoelectron spectroscopy
Article first published online: 3 AUG 2011
Copyright © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
physica status solidi (b)
Volume 249, Issue 1, pages 58–61, January 2012
How to Cite
Kumar, M., Rajpalke, M. K., Roul, B., Bhat, T. N., Kalghatgi, A. T. and Krupanidhi, S. B. (2012), Determination of MBE grown wurtzite GaN/Ge3N4/Ge heterojunctions band offset by X-ray photoelectron spectroscopy. Phys. Status Solidi B, 249: 58–61. doi: 10.1002/pssb.201147318
- Issue published online: 12 DEC 2011
- Article first published online: 3 AUG 2011
- Manuscript Accepted: 6 JUL 2011
- Manuscript Revised: 5 JUL 2011
- Manuscript Received: 1 JUN 2011
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