Dedicated to Stanford R. Ovshinsky on the occasion of his 90th birthday
Characterization of Ge2Sb2Te5 thin film alloys using conductive-tip atomic force microscopy†
Version of Record online: 21 AUG 2012
Copyright © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
physica status solidi (b)
Special Issue: Phase-change memory: Science and applications
Volume 249, Issue 10, pages 1945–1950, October 2012
How to Cite
Chang, C. M., Liu, Y. J., Tseng, M. L., Chu, N.-N., Huang, D.-W., Mansuripur, M. and Tsai, D. P. (2012), Characterization of Ge2Sb2Te5 thin film alloys using conductive-tip atomic force microscopy. Phys. Status Solidi B, 249: 1945–1950. doi: 10.1002/pssb.201200356
- Issue online: 8 OCT 2012
- Version of Record online: 21 AUG 2012
- Manuscript Accepted: 30 JUL 2012
- Manuscript Revised: 21 JUN 2012
- Manuscript Received: 12 JUN 2012
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