Defect and analysis effects in the infrared optical properties of silicon
Article first published online: 18 JAN 2013
Copyright © 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
physica status solidi (b)
Volume 250, Issue 2, pages 271–277, February 2013
How to Cite
Smith, D. Y., Karstens, W., Shiles, E. and Inokuti, M. (2013), Defect and analysis effects in the infrared optical properties of silicon. Phys. Status Solidi B, 250: 271–277. doi: 10.1002/pssb.201200495
- Issue published online: 7 FEB 2013
- Article first published online: 18 JAN 2013
- Manuscript Accepted: 8 NOV 2012
- Manuscript Received: 19 JUL 2012
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