A neutron reflectometry study on silicon self-diffusion at 900 °C
Version of Record online: 14 AUG 2012
Copyright © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
physica status solidi (b)
Volume 249, Issue 11, pages 2108–2112, November 2012
How to Cite
Hüger, E., Kube, R., Bracht, H., Stahn, J., Geue, T. and Schmidt, H. (2012), A neutron reflectometry study on silicon self-diffusion at 900 °C. Phys. Status Solidi B, 249: 2108–2112. doi: 10.1002/pssb.201248330
- Issue online: 7 NOV 2012
- Version of Record online: 14 AUG 2012
- Manuscript Accepted: 19 JUL 2012
- Manuscript Revised: 12 JUL 2012
- Manuscript Received: 15 MAY 2012
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