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The 71° stripe domain patterns of epitaxial multiferroic BiFeO3 thin films are being explored to achieve new functional properties, dissimilar from the BiFeO3 bulk properties. For example, the employment of BiFeO3 films with 71° domain patterns was reported for electric-field induced reversal of the magnetization in CoFe/BiFeO3 heterostructures. In their article on pp. 2278–2286, Johann et al. address the stability of these ferroelectric domain patterns under repeated electrical switching. This is an essential issue if BiFeO3 is considered to be used in device fabrication. The authors show that in-plane switching and out-of-plane switching of these domains behave very differently. In the in-plane configuration the domains are very stable, whereas in the out-of-plane configuration the domains change their size and patterns, depending on the applied switching voltage frequency.