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Keywords:

  • 68.65.Ac;
  • 68.65.Hb;
  • 78.55.Cr;
  • 78.67.Hc

Abstract

Vertically stacked self-assembled InAs/GaAs quantum dots (QDs) structures with different GaAs spacer layer thicknesses are investigated by photoluminescence spectroscopy (PL). For correlated structures, the PL full widths at half maximum (FWHM) is found to go throw a minimum and the PL intensity throw a maximum for a spacer layer thickness around 8.5 nm. The effect of post growth rapid thermal annealing (RTA) on the PL properties of the optimized structure is discussed. (© 2005 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)