Original Paper
Fluctuations and dark count rates in superconducting NbN single-photon detectors
Article first published online: 9 MAR 2005
DOI: 10.1002/pssc.200460809
Copyright © 2005 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Additional Information
How to Cite
Engel, A., Semenov, A., Hübers, H.-W., Il'in, K. and Siegel, M. (2005), Fluctuations and dark count rates in superconducting NbN single-photon detectors. phys. stat. sol. (c), 2: 1668–1673. doi: 10.1002/pssc.200460809
Publication History
- Issue published online: 9 MAR 2005
- Article first published online: 9 MAR 2005
- Manuscript Accepted: 5 OCT 2004
- Manuscript Revised: 8 SEP 2004
- Manuscript Received: 6 SEP 2004
- Abstract
- Cited By
Keywords:
- 74.40.+k;
- 74.78.Na;
- 85.25.Oj
Abstract
We measured the temperature- and current-dependence of dark count rates of a superconducting singlephoton detector. The detector's key element is a 84 nm wide meander strip line fabricated from a 5 nm thick NbN film. Due to its reduced dimensions various types of fluctuations can cause temporal and localized transitions into a resistive state leading to dark count events. Adopting a recent refinement of the hotspot model we achieve a satisfying description of the experimental dark count rates taking into account fluctuations of the Cooper-pair density and current-assisted unbinding of vortex-antivortex pairs. (© 2005 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)

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