Secondary electron imaging of titania thin film for surface potential analysis

Authors

  • Kazuhiro Kumagai,

    Corresponding author
    1. Graduate School for Pure and Applied Science, University of Tsukuba, 1-1 Namiki, 305 0044 Tsukuba, Japan
    2. Advanced Electronic Materials Centre, National Institute for Materials Science, 1-1 Namiki, 305 0044 Tsukuba, Japan
    • Phone: +81 29 851 3354 ext.8896, Fax: +81 29 851 4794
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  • Takashi Sekiguchi

    1. Graduate School for Pure and Applied Science, University of Tsukuba, 1-1 Namiki, 305 0044 Tsukuba, Japan
    2. Advanced Electronic Materials Centre, National Institute for Materials Science, 1-1 Namiki, 305 0044 Tsukuba, Japan
    Search for more papers by this author
    • Phone: +81 29 860 4297, Fax: +81 29 851 4794


Abstract

We demonstrate the surface potential sensitivity of secondary electron (SE) imaging of titania thin film by scanning electron microscopy (SEM), and discuss the image formation mechanism. The 1-nm titania film on Si substrate was imaged as bright region against the substrate. The SE image of the film varied with SE detector, but did not with primary electron energy. The contrast of the film was reversed by only 1-nm carbon deposition. This result suggests that a slight change of surface potential altered the efficiency of secondary electron emission. This high sensitivity of secondary electrons to the surface potential is promising for improvement of thin-film observation by SEM. (© 2011 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)

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