Low loss EEL spectroscopy performed on InxAl1-xN layers grown by MOVPE: comparison between experiment and ab-initio calculations

Authors


Abstract

We present Electron Energy-Loss Spectroscopy (EELS) studies of InxAl1-xN MOVPE epilayers containing 16-28 at% of indium. EELS investigations show a significant change of the plasmon energy (Ep) with the indium concentration. In the case of these compounds, the results have been compared for the first time with ab-initio calculations performed with Wien2k and present a good agreement. Ep follows a linear relation with respect to composition allowing the correct identification of the spectra features. The acquisitions of the low-loss EELS spectra have been performed in the homogeneous area for all the InxAl1-xN samples. (© 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)

Ancillary