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Keywords:

  • Seebeck coefficient;
  • reference material;
  • figure of merit;
  • traceable measurement;
  • metallic alloy;
  • semiconductors

Abstract

The paper describes a measuring system and a measuring method to measure the Seebeck coefficient and the electrical conductivity of different bulk materials. Some improvements of the original setup allow a reduction of the achievable relative measurement uncertainty regarding the Seebeck coefficient to a few percent. This is demonstrated by the results of Seebeck coefficient measurements of metallic and different semiconducting samples (© 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)