Positron annihilation lifetime study of extended defects in semiconductor glasses and polymers


  • Olha Boyko,

    Corresponding author
    1. Department of Pediatric Dentistry, Danylo Halytsky Lviv National Medical University, Pekarska str. 69, 79010 Lviv, Ukraine
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  • Yaroslav Shpotyuk,

    1. Department of Optoelectronics and Information Technologies, Ivan Franko National University of Lviv, Dragomanova str. 50, 79005 Lviv, Ukraine
    2. Lviv Scientific Research Institute of Materials, Scientific Research Company “Carat”, Stryjska str. 202, 79031 Lviv, Ukraine
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  • Jacek Filipecki

    1. Institute of Physics, Jan Dlugosz University in Czestochowa, Armii Krajowej al. 13/15, 42200 Czestochowa, Poland
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The processes of atomic shrinkage in network-forming solids initiated by external influences are tested using technique of positron annihilation lifetime spectroscopy at the example of chalcogenide vitreous semiconductors of arsenic sulphide type and acrylic polymers for dental application. Two state positron trapping is shown to be responsible for atomic shrinkage in chalcogenide glasses, while mixed trapping and ortho-positronium decaying is character for volumetric densification and stress propagation in acrylic dental polymers.

At the basis of the obtained results it is concluded that correct analysis of externally-induced shrinkage in polymer networks under consideration can be developed by using original positron lifetime data treatment algorithms to compensate defect-free bulk annihilation channel within two-state positron trapping model and account for an interbalance between simultaneously co-existing positron trapping and orth-positronium related decaying channels within mixed three-state positron annihilation model (© 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)