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Positron annihilation lifetime study of extended defects in semiconductor glasses and polymers

  1. Olha Boyko1,*,
  2. Yaroslav Shpotyuk3,4,
  3. Jacek Filipecki2

Article first published online: 5 DEC 2012

DOI: 10.1002/pssc.201200406

Issue

physica status solidi (c)

physica status solidi (c)

Special Issue: International Conference on Extended Defects in Semiconductors (EDS 2012), see further papers in Phys. Status Solidi A 210, No. 1 (2013).

Volume 10, Issue 1, pages 121–124, January 2013

Additional Information

How to Cite

Boyko, O., Shpotyuk, Y. and Filipecki, J. (2013), Positron annihilation lifetime study of extended defects in semiconductor glasses and polymers. Phys. Status Solidi C, 10: 121–124. doi: 10.1002/pssc.201200406

Author Information

  1. 1

    Department of Pediatric Dentistry, Danylo Halytsky Lviv National Medical University, Pekarska str. 69, 79010 Lviv, Ukraine

  2. 2

    Institute of Physics, Jan Dlugosz University in Czestochowa, Armii Krajowej al. 13/15, 42200 Czestochowa, Poland

  3. 3

    Department of Optoelectronics and Information Technologies, Ivan Franko National University of Lviv, Dragomanova str. 50, 79005 Lviv, Ukraine

  4. 4

    Lviv Scientific Research Institute of Materials, Scientific Research Company “Carat”, Stryjska str. 202, 79031 Lviv, Ukraine

*Phone: +38 032 263 83 03, Web: www.chalcogenide.org

Publication History

  1. Issue published online: 24 JAN 2013
  2. Article first published online: 5 DEC 2012
  3. Manuscript Accepted: 9 OCT 2012
  4. Manuscript Revised: 26 JUL 2012
  5. Manuscript Received: 20 JUN 2012

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Keywords:

  • network glasses;
  • polymers;
  • positron annihilation;
  • extended defect;
  • shrinkage

Abstract

The processes of atomic shrinkage in network-forming solids initiated by external influences are tested using technique of positron annihilation lifetime spectroscopy at the example of chalcogenide vitreous semiconductors of arsenic sulphide type and acrylic polymers for dental application. Two state positron trapping is shown to be responsible for atomic shrinkage in chalcogenide glasses, while mixed trapping and ortho-positronium decaying is character for volumetric densification and stress propagation in acrylic dental polymers.

At the basis of the obtained results it is concluded that correct analysis of externally-induced shrinkage in polymer networks under consideration can be developed by using original positron lifetime data treatment algorithms to compensate defect-free bulk annihilation channel within two-state positron trapping model and account for an interbalance between simultaneously co-existing positron trapping and orth-positronium related decaying channels within mixed three-state positron annihilation model (© 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)

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