Cover Picture: Phys. Status Solidi C 1/2013
Article first published online: 24 JAN 2013
Copyright © 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
physica status solidi (c)
Special Issue: International Conference on Extended Defects in Semiconductors (EDS 2012), see further papers in Phys. Status Solidi A 210, No. 1 (2013).
Volume 10, Issue 1, January 2013
How to Cite
(2013), Cover Picture: Phys. Status Solidi C 1/2013. Phys. Status Solidi C, 10: n/a. doi: 10.1002/pssc.201390000
- Issue published online: 24 JAN 2013
- Article first published online: 24 JAN 2013
- Cited By
J. Rabier, A. Montagne, J. M. Wheeler, J. L. Demenet, J. Michler, and R. Ghisleni (pp. 11–15) report on the plastic deformation of silicon micropillars oriented for single slip (123 orientation). A low strain rate was used in order to probe plastic deformation in a large range of temperature for pillars having the same diameter. The cover figure shows deformation features imaged by scanning electron microscopy (SEM) for different deformation temperatures. The amount of plasticity obtained before failure increases significantly with temperature. In situ SEM experiments allowed us to relate microstructural features appearing in the images to the mechanical data from the recorded stress–strain curves.