J. Rabier, A. Montagne, J. M. Wheeler, J. L. Demenet, J. Michler, and R. Ghisleni (pp. 11–15) report on the plastic deformation of silicon micropillars oriented for single slip (123 orientation). A low strain rate was used in order to probe plastic deformation in a large range of temperature for pillars having the same diameter. The cover figure shows deformation features imaged by scanning electron microscopy (SEM) for different deformation temperatures. The amount of plasticity obtained before failure increases significantly with temperature. In situ SEM experiments allowed us to relate microstructural features appearing in the images to the mechanical data from the recorded stress–strain curves.