physica status solidi (c)

Cover image for Vol. 5 Issue 5

Special Issue: 4th International Conference on Spectroscopic Ellipsometry (ICSE4)

May 2008

Volume 5, Issue 5

Pages 991–1445

  1. Cover Picture

    1. Top of page
    2. Cover Picture
    3. Contents
    4. Preface
    5. Contributed Articles
    6. Information for authors
    1. Fast near-infra-red spectroscopic Mueller matrix ellipsometer based on ferroelectric liquid crystal retarders

      J. Ladstein, F. Stabo-Eeg, E. Garcia-Caurel and M. Kildemo

      Article first published online: 8 MAY 2008 | DOI: 10.1002/pssc.200890005

  2. Contents

    1. Top of page
    2. Cover Picture
    3. Contents
    4. Preface
    5. Contributed Articles
    6. Information for authors
    1. Contents: phys. stat. sol. (a) 205/5 (pages 991–999)

      Article first published online: 8 MAY 2008 | DOI: 10.1002/pssc.200860015

  3. Preface

    1. Top of page
    2. Cover Picture
    3. Contents
    4. Preface
    5. Contributed Articles
    6. Information for authors
    1. Preface: phys. stat. sol. (c) 5/5 (pages 1000–1002)

      Hans Arwin, Uwe Beck and Mathias Schubert

      Article first published online: 8 MAY 2008 | DOI: 10.1002/pssc.200860016

  4. Contributed Articles

    1. Top of page
    2. Cover Picture
    3. Contents
    4. Preface
    5. Contributed Articles
    6. Information for authors
    1. First-order phase transitions of spin-crossover and charge transfer solids probed by spectroscopic ellipsometry (pages 1003–1006)

      K. Boukheddaden, E.D. Loutete-Dangui, M. Koubaa and C. Eypert

      Article first published online: 19 MAR 2008 | DOI: 10.1002/pssc.200777877

    2. Dielectric and magnetic birefringence in low-chlorine-doped n -type Zn1–xMnxSe (pages 1007–1011)

      M. F. Saenger, M. Hetterich, T. Hofmann, R. D. Kirby, D. J. Sellmyer and M. Schubert

      Article first published online: 19 MAR 2008 | DOI: 10.1002/pssc.200777907

    3. Applications of interferometric ellipsometry (pages 1012–1015)

      S. Kawabata, T. Matsumoto, M. Wakaki and J. Chen

      Article first published online: 19 MAR 2008 | DOI: 10.1002/pssc.200777730

    4. A new type of liquid refractometer (pages 1020–1022)

      Jiun-You Lin, Jing-Heng Chen, Kun-Huang Chen and Der-Chin Su

      Article first published online: 20 FEB 2008 | DOI: 10.1002/pssc.200777736

    5. An alternative method for simultaneously measuring cell parameters of a twisted-nematic liquid crystal cell (pages 1023–1026)

      Kun-Huang Chen, Jing-Heng Chen, Jiun-You Lin, Der-Chin Su and Jung-Chieh Su

      Article first published online: 20 FEB 2008 | DOI: 10.1002/pssc.200777738

    6. Quantifying the accuracy of ellipsometer systems (pages 1031–1035)

      Blaine Johs and C. M. Herzinger

      Article first published online: 20 FEB 2008 | DOI: 10.1002/pssc.200777755

    7. Optimizing precision of rotating compensator ellipsometry (pages 1036–1040)

      L. Broch and L. Johann

      Article first published online: 20 FEB 2008 | DOI: 10.1002/pssc.200777761

    8. IMaX: a polarimeter based on Liquid Crystal Variable Retarders for an aerospace mission (pages 1041–1045)

      N. Uribe-Patarroyo, A. Alvarez-Herrero, R. L. Heredero, J. C. del Toro Iniesta, A. C. López Jiménez, V. Domingo, J. L. Gasent, L. Jochum, V. Martínez Pillet and The IMaX Team

      Article first published online: 20 FEB 2008 | DOI: 10.1002/pssc.200777771

    9. An auto-focusing method for imaging ellipsometry system (pages 1046–1049)

      Y. H. Meng, S. Chen and G. Jin

      Article first published online: 20 FEB 2008 | DOI: 10.1002/pssc.200777781

    10. Product decompositions of experimentally determined non-depolarizing Mueller matrices (pages 1059–1063)

      R. Ossikovski, E. Garcia-Caurel and A. De Martino

      Article first published online: 7 MAR 2008 | DOI: 10.1002/pssc.200777794

    11. Wide angle beam ellipsometry for extremely large samples (pages 1077–1080)

      C. Major, G. Juhász, Z. Horváth, O. Polgar and M. Fried

      Article first published online: 19 MAR 2008 | DOI: 10.1002/pssc.200777859

    12. Non-collimated beam ellipsometry (pages 1081–1084)

      G. Juhász, Z. Horváth, C. Major, P. Petrik, O. Polgár and M. Fried

      Article first published online: 19 MAR 2008 | DOI: 10.1002/pssc.200777862

    13. Fast near-infra-red spectroscopic Mueller matrix ellipsometer based on ferroelectric liquid crystal retarders (pages 1097–1100)

      J. Ladstein, F. Stabo-Eeg, E. Garcia-Caurel and M. Kildemo

      Article first published online: 17 MAR 2008 | DOI: 10.1002/pssc.200777902

    14. Optical properties of TiO2 films made by air oxidation of Ti (pages 1101–1104)

      S. N. Svitasheva, V. A. Gritsenko and B. A. Kolesov

      Article first published online: 19 MAR 2008 | DOI: 10.1002/pssc.200777731

    15. Control of the concentration of protons intercalated into tungsten oxide thin films during deposition (pages 1105–1108)

      Y. Yamada, K. Tajima, M. Okada, S. Bao, M. Tazawa, K. Yoshimura and A. Roos

      Article first published online: 20 FEB 2008 | DOI: 10.1002/pssc.200777734

    16. A spectroscopic ellipsometry investigation of RF-sputtered crystalline vanadium pentoxide thin films (pages 1109–1112)

      S. Oukassi, X. Gagnard, R. Salot, D. Zahorski, J. L. Stehlé, J. P. Piel and J. P. Pereira-Ramos

      Article first published online: 19 MAR 2008 | DOI: 10.1002/pssc.200777744

    17. Spectroscopic ellipsometry of materials for infrared micro-device fabrication (pages 1113–1116)

      W. R. Folks, J. Ginn, D. Shelton, J. Tharp and G. Boreman

      Article first published online: 20 FEB 2008 | DOI: 10.1002/pssc.200777748

    18. Spectroscopic ellipsometry of silicon-containing diamond-like carbon (DLC-Si) films (pages 1117–1120)

      Naohiko Kato, Hiroyuki Mori and Naoko Takahashi

      Article first published online: 20 FEB 2008 | DOI: 10.1002/pssc.200777751

    19. Temperature-dependent spectro-ellipsometric studies of optical transitions near absorption edge of TlInS2 (pages 1121–1124)

      Y. Shim, Y. Nishimoto, W. Okada, K. Wakita and N. Mamedov

      Article first published online: 20 FEB 2008 | DOI: 10.1002/pssc.200777758

    20. Spectroscopic ellipsometry analysis of multilayered TiO2-Ag thin films for photochromic application (pages 1125–1128)

      L. Miao, T. Jiang, S. Tanemura, M. Tanemura, N. Nabatova-Gabain and G. Xu

      Article first published online: 20 FEB 2008 | DOI: 10.1002/pssc.200777759

    21. Ellipsometric characterization of photo-resist gratings using artificial neural network (pages 1133–1136)

      I. Gereige, S. Robert, M. Stchakovsky, D. Jamon, F. Celle, S. Reynaud, J. C. Pommier and Y. Jourlin

      Article first published online: 19 MAR 2008 | DOI: 10.1002/pssc.200777763

    22. IR-VIS-UV ellipsometry, XRD and AES investigation of In/Cu and In/Pd thin films (pages 1141–1144)

      A. A. Wronkowska, H. Arwin, A. Bukaluk, Ł. Skowroński, M. Trzcinski, K. Okulewicz and A. Wronkowski

      Article first published online: 20 FEB 2008 | DOI: 10.1002/pssc.200777777

    23. Optical properties of NiCrOx thin films (pages 1145–1149)

      Nora Dahmouchène, Michel Voué, Jean-Louis Stehlé, Christophe Defranoux, Corinne Nouvellon and Joel De Coninck

      Article first published online: 20 FEB 2008 | DOI: 10.1002/pssc.200777780

    24. Ellipsometry study of ultra thin layers of evaporated gold (pages 1150–1155)

      Alexei Nabok, Anna Tsargorodskaya and Suryajaya

      Article first published online: 19 MAR 2008 | DOI: 10.1002/pssc.200777786

    25. Temperature dependence of the optical and kinetic properties of photochromic spirooxazine derivatives in sol-gel thin films (pages 1160–1163)

      Alberto Alvarez-Herrero, Daniel Garranzo, Rosario Pardo, Marcos Zayat and David Levy

      Article first published online: 7 MAR 2008 | DOI: 10.1002/pssc.200777789

    26. UV irradiation effects on TiO2 thin films (pages 1164–1167)

      M. Fernández-Rodríguez, V. J. Rico, A. R. González-Elipe and A. Álvarez-Herrero

      Article first published online: 7 MAR 2008 | DOI: 10.1002/pssc.200777790

    27. Ellipsometry characterization of bulk acoustic wave filters (pages 1168–1171)

      E. Nolot, A. Lefevre and J. N. Hilfiker

      Article first published online: 7 MAR 2008 | DOI: 10.1002/pssc.200777795

    28. Surface solidification in liquid Ga-Tl alloys (pages 1172–1175)

      Kai Bartel, Werner Freyland and Detlef Nattland

      Article first published online: 7 MAR 2008 | DOI: 10.1002/pssc.200777799

    29. Temperature dependence of ellipsometric spectra of Fe and CrNiAl steel (pages 1176–1179)

      A. Nebojsa, O. Fikarová Zrzavecká, K. Navrátil and J. Humlíček

      Article first published online: 7 MAR 2008 | DOI: 10.1002/pssc.200777816

    30. Spectroscopic ellipsometry study of amorphous SrxBa1–xNb2O6 thin films obtained by pulsed laser deposition (pages 1180–1183)

      V. Ion, A. C. Gâlcă, N. D. Scărisoreanu, M. Filipescu and M. Dinescu

      Article first published online: 17 MAR 2008 | DOI: 10.1002/pssc.200777818

    31. The water-like film on water (pages 1184–1186)

      R. Greef and J. G. Frey

      Article first published online: 7 MAR 2008 | DOI: 10.1002/pssc.200777820

    32. Adsorption of rhodamine 6G at the water-air interface (pages 1187–1189)

      R. Greef, J. G. Frey, J. Robinson and L. Danos

      Article first published online: 7 MAR 2008 | DOI: 10.1002/pssc.200777821

    33. Analysis of carrier parameters and bandgap of electroplated Bi2Te3 films by infrared spectroscopic ellipsometry (pages 1190–1193)

      A. Zimmer, N. Stein, H. Terryn, L. Johann and C. Boulanger

      Article first published online: 7 MAR 2008 | DOI: 10.1002/pssc.200777824

    34. Optical nanometrology of Au nanoparticles on a multilayer film (pages 1194–1197)

      Yia-Chung Chang, Shih-Hsin Hsu, Pei-Kuen Wei and Young Dong Kim

      Article first published online: 7 MAR 2008 | DOI: 10.1002/pssc.200777834

    35. Ellipsometric studies of diamond like carbon films prepared by PECVD using pulsed DC power supply (pages 1198–1201)

      D. K. Rai, Debjit Datta, Rajeev Gupta and Satyendra Kumar

      Article first published online: 19 MAR 2008 | DOI: 10.1002/pssc.200777837

    36. Temperature dependent reflection anisotropy spectroscopy investigations of vanadyl phthalocyanine films (pages 1202–1205)

      Michael Fronk, Björn Bräuer, Dietrich Zahn and Georgeta Salvan

      Article first published online: 19 MAR 2008 | DOI: 10.1002/pssc.200777838

    37. 41lanthanum-based dielectric films analyzed by spectroscopic ellipsometry, X-ray reflectometry and X-ray photoelectron spectroscopy (pages 1206–1209)

      V. Edon, M. Gaillet, M.C. Hugon, C. Eypert, O. Durand and C. Cardinaud

      Article first published online: 7 MAR 2008 | DOI: 10.1002/pssc.200777839

    38. Silver nanoparticles embedded in polymer matrices - a FTIR-SE study (pages 1210–1214)

      Nora Dahmouchène, Séverine Coppée, Michel Voué and Joel De Coninck

      Article first published online: 17 MAR 2008 | DOI: 10.1002/pssc.200777840

    39. Study of environmental degradation of silver surface (pages 1215–1218)

      H. Águas, R. J. C. Silva, M. Viegas, L. Pereira, E. Fortunato and R. Martins

      Article first published online: 8 MAY 2008 | DOI: 10.1002/pssc.200777842

    40. Defect profiling by ellipsometry using ion implantation through wedge masks (pages 1227–1230)

      M. Fried, N. Q. Khanh and P. Petrik

      Article first published online: 17 MAR 2008 | DOI: 10.1002/pssc.200777863

    41. Characterization of Ru and RuO2 thin films prepared by pulsed metal organic chemical vapor deposition (pages 1231–1234)

      G. Roeder, C. Manke, P. K. Baumann, S. Petersen, V. Yanev, A. Gschwandtner, G. Ruhl, P. Petrik, M. Schellenberger, L. Pfitzner and H. Ryssel

      Article first published online: 19 MAR 2008 | DOI: 10.1002/pssc.200777865

    42. Optical modeling and XRR/AFM characterization of highly conductive thin Ag layers (pages 1235–1239)

      S. Ulrich, A. Pflug, K. Schiffmann and B. Szyszka

      Article first published online: 19 MAR 2008 | DOI: 10.1002/pssc.200777870

    43. Structural and optical properties of ZrO2 and Al2O3 thin films and Bragg reflectors grown by pulsed laser deposition (pages 1240–1243)

      J. Sellmann, Ch. Sturm, R. Schmidt-Grund, Ch. Czekalla, J. Lenzner, H. Hochmuth, B. Rheinländer, M. Lorenz and M. Grundmann

      Article first published online: 17 MAR 2008 | DOI: 10.1002/pssc.200777875

    44. Spectroscopic ellipsometry studies of In2S3 top window and Mo back contacts in chalcopyrite photovoltaics technology (pages 1244–1248)

      S. Marsillac, N. Barreau, H. Khatri, J. Li, D. Sainju, A. Parikh, N. J. Podraza and R. W. Collins

      Article first published online: 17 MAR 2008 | DOI: 10.1002/pssc.200777889

    45. Effects of ion concentration on refractive indices of fluids measured by the minimum deviation technique (pages 1249–1252)

      T. Berlind, G. K. Pribil, D. Thompson, J. A. Woollam and H. Arwin

      Article first published online: 17 MAR 2008 | DOI: 10.1002/pssc.200777897

    46. Spectroscopic ellipsometry and ellipsometric porosimetry studies of CVD low-k dielectric films (pages 1253–1256)

      P. Marsik, P. Verdonck, D. Schneider, D. De Roest, S. Kaneko and M. R. Baklanov

      Article first published online: 20 FEB 2008 | DOI: 10.1002/pssc.200777742

    47. Fréedericksz transition in homeotropically aligned liquid crystals: a photopolarimetric characterization (pages 1257–1260)

      C. Vena, C. Versace, G. Strangi, St. D'Elia and R. Bartolino

      Article first published online: 19 MAR 2008 | DOI: 10.1002/pssc.200777804

    48. Dynamics of UV degradation of PMPSi in vacuum and in the air using in-situ ellipsometry (pages 1261–1264)

      O. Fikarová Zrzavecká, A. Nebojsa, K. Navrátil, S. Nešpůrek and J. Humlíček

      Article first published online: 7 MAR 2008 | DOI: 10.1002/pssc.200777814

    49. Investigation of the optical properties of organic-inorganic hybrid polymers by IR to Vis-fUV spectroscopic ellipsometry (pages 1265–1269)

      S. Logothetidis, A. Laskarakis, D. Georgiou, S. Amberg-Schwab and U. Weber

      Article first published online: 7 MAR 2008 | DOI: 10.1002/pssc.200777828

    50. On the determination of anisotropy in polymer thin films: A comparative study of optical techniques (pages 1270–1273)

      M. Campoy-Quiles, J. Nelson, P. G. Etchegoin, D. D. C. Bradley, V. Zhokhavets, G. Gobsch, H. Vaughan, A. Monkman, O. Ingänas, N. K. Persson, H. Arwin, M. Garriga, M. I. Alonso, G. Herrmann, M. Becker, W. Scholdei, M. Jahja and C. Bubeck

      Article first published online: 7 MAR 2008 | DOI: 10.1002/pssc.200777835

    51. UV-induced in-plane anisotropy in layers of mixture of the azo-dyes SD-1/SDA-2 characterized by spectroscopic ellipsometry (pages 1274–1277)

      Iryna Valyukh, Hans Arwin, Vladimir Chigrinov and Sergiy Valyukh

      Article first published online: 17 MAR 2008 | DOI: 10.1002/pssc.200777881

    52. Evaluation of ellipsometric porosimetry for in-line characterization of ultra low-κ dielectrics (pages 1278–1282)

      C. Licitra, F. Bertin, M. Darnon, T. Chevolleau, C. Guedj, S. Cetre, H. Fontaine, A. Zenasni and L. L. Chapelon

      Article first published online: 20 FEB 2008 | DOI: 10.1002/pssc.200777776

    53. Real-time ellipsometric study of Ge+ ion implanted SiO2 layers during fast annealing (pages 1287–1289)

      V. A. Shvets, I. E. Tyschenko, S. I. Chikichev and V. Yu. Prokopiev

      Article first published online: 19 MAR 2008 | DOI: 10.1002/pssc.200777815

    54. Multilayer optical filters control by multi-channel kinetic ellipsometry (pages 1290–1294)

      B. Haj Ibrahim, R. Botha, P. Bulkin and B. Drévillon

      Article first published online: 7 MAR 2008 | DOI: 10.1002/pssc.200777819

    55. Real-time spectroscopic ellipsometry for protein adsorption study and pH effect (pages 1295–1299)

      S. Lousinian and S. Logothetidis

      Article first published online: 19 MAR 2008 | DOI: 10.1002/pssc.200777826

    56. In-situ and real-time monitoring of high barrier layers growth onto polymeric substrates (pages 1300–1303)

      D. Georgiou, S. Logothetidis, C. Koidis and A. Laskarakis

      Article first published online: 7 MAR 2008 | DOI: 10.1002/pssc.200777827

    57. Cu underpotential deposition on Au controlled by in situ Spectroscopic Ellipsometry (pages 1304–1307)

      Mirko Prato, Antonio Gussoni, Marco Panizza, Ornella Cavalleri, Lorenzo Mattera and Maurizio Canepa

      Article first published online: 17 MAR 2008 | DOI: 10.1002/pssc.200777882

    58. In situ ellipsometric studies of formation kinetics of rare earth metal conversion coatings on magnesium alloy (pages 1308–1311)

      Lingjie Li, Jinglei Lei, Shenghai Yu, Donghai He, Weijuan Qu and Fusheng Pan

      Article first published online: 17 MAR 2008 | DOI: 10.1002/pssc.200777890

    59. Spectroscopic ellipsometry of anodized layer on single crystal InAsSb layer grown by melt epitaxy (pages 1316–1319)

      K. Postava, Y. Z. Gao, X. Y. Gong, L. Halagačka, J. Pištora, A. Nakaoka and T. Yamaguchi

      Article first published online: 20 FEB 2008 | DOI: 10.1002/pssc.200777757

    60. Optical characterization of non-stoichiometric silicon nitride films (pages 1320–1323)

      David Necas, Vratislav Perina, Daniel Franta, Ivan Ohlídal and Josef Zemek

      Article first published online: 20 FEB 2008 | DOI: 10.1002/pssc.200777767

    61. Optical characterization of phase changing Ge2Sb2Te5 chalcogenide films (pages 1324–1327)

      Daniel Franta, Martin Hrdlicka, David Necas, Miloslav Frumar, Ivan Ohlídal and Martin Pavli šta

      Article first published online: 20 FEB 2008 | DOI: 10.1002/pssc.200777768

    62. Electrooptic ellipsometry study of piezoelectric BaTiO3-ZnO heterostructures (pages 1328–1331)

      V. M. Voora, T. Hofmann, M. Brandt, M. Lorenz, M. Grundmann and M. Schubert

      Article first published online: 19 MAR 2008 | DOI: 10.1002/pssc.200777908

    63. Spectroscopic ellipsometric study of Ge nanocrystals embedded in SiO2 using parametric models (pages 1332–1336)

      P. Basa, P. Petrik, M. Fried, A. Dâna, A. Aydinli, S. Foss and T. G. Finstad

      Article first published online: 20 FEB 2008 | DOI: 10.1002/pssc.200777773

    64. Comparative investigation of the Si/SiO2 interface layer containing SiC crystallites using spectroscopic ellipsometry, ion beam analysis and XPS (pages 1337–1340)

      T. Lohner, A. Pongrácz, N. Q. Khánh, O. H. Krafcsik, K. V. Josepovits and P. Deák

      Article first published online: 7 MAR 2008 | DOI: 10.1002/pssc.200777791

    65. A multi-sensor study of Cl2 etching of polycrystalline Si (pages 1341–1345)

      Pete I. Klimecky and Fred L. Terry Jr.

      Article first published online: 7 MAR 2008 | DOI: 10.1002/pssc.200777807

    66. Structural order of thin film silicon made at 100 °C (pages 1346–1349)

      Jatindra K. Rath, Ruud E. I. Schropp and Pere Roca i Cabarocas

      Article first published online: 7 MAR 2008 | DOI: 10.1002/pssc.200777825

    67. Investigation of the free charge carrier properties at the ZnO-sapphire interface in a-plane ZnO films studied by generalized infrared ellipsometry (pages 1350–1353)

      C. Sturm, T. Chavdarov, R. Schmidt-Grund, B. Rheinländer, C. Bundesmann, H. Hochmuth, M. Lorenz, M. Schubert and M. Grundmann

      Article first published online: 17 MAR 2008 | DOI: 10.1002/pssc.200777853

    68. Ion implantation induced disorder in single-crystal and sputter-deposited polycrystalline CdTe characterized by ellipsometry and backscattering spectrometry (pages 1358–1361)

      P. Petrik, N. Q. Khánh, Jian Li, Jie Chen, R. W. Collins, M. Fried, G. Z. Radnóczi, T. Lohner and J. Gyulai

      Article first published online: 19 MAR 2008 | DOI: 10.1002/pssc.200777866

    69. Optical properties of PZT thin films by spectroscopic ellipsometry and optical reflectivity (pages 1362–1365)

      D. Chvostová, L. Pajasová and V. Železný

      Article first published online: 19 MAR 2008 | DOI: 10.1002/pssc.200777869

    70. In-situ and real-time investigation of ZnO thin films growth onto rigid and flexible substrates (pages 1366–1369)

      C. Koidis, S. Logothetidis, D. Georgiou and A. Laskarakis

      Article first published online: 17 MAR 2008 | DOI: 10.1002/pssc.200777872

    71. Characterization of silicide stacks by combination of spectroscopic ellipsometry and reflectometry (pages 1370–1373)

      O. Fursenko, D. Bolze, I. Costina, P. Zaumseil, T. Huelsmann, J. Niess and W. Lerch

      Article first published online: 17 MAR 2008 | DOI: 10.1002/pssc.200777879

    72. Complex dielectric function of ion implantation amorphized SiC determined by spectroscopic ellipsometry (pages 1374–1377)

      T. Lohner, Z. Zolnai, P. Petrik, G. Battistig, J. Garcia López, Y. Morilla, A. Koós, Z. Osváth and M. Fried

      Article first published online: 17 MAR 2008 | DOI: 10.1002/pssc.200777883

    73. Optical response of nanostructured GaSb (pages 1382–1385)

      M. Kildemo, I. S. Nerbø, E. Søndergård, L. Holt, I. Simonsen and M. Stchakovsky

      Article first published online: 17 MAR 2008 | DOI: 10.1002/pssc.200777903

    74. Optical Hall effect studies on modulation-doped AlxGa1–xAs:Si/GaAs quantum wells (pages 1386–1390)

      T. Hofmann, C. von Middendorff, V. Gottschalch and M. Schubert

      Article first published online: 19 MAR 2008 | DOI: 10.1002/pssc.200777905

    75. Ellipsometric studies of opal crystals (pages 1391–1394)

      A. Reza, R. Tamasevicius, J. Babonas, Z. Balevicius, V. Vaicikauskas, V. Golubev and D. Kurdyukov

      Article first published online: 19 MAR 2008 | DOI: 10.1002/pssc.200777739

    76. Optical quantities of rough films calculated by Rayleigh-Rice theory (pages 1395–1398)

      Daniel Franta, Ivan Ohlídal and David Necas

      Article first published online: 20 FEB 2008 | DOI: 10.1002/pssc.200777766

    77. Spectroscopic ellipsometry on photonic crystals made by self-assembled dye-doped P(S/HEMA) nanospheres (pages 1403–1406)

      S. Schutzmann, P. Prosposito, M. Casalboni, I. Venditti and M. V. Russo

      Article first published online: 20 FEB 2008 | DOI: 10.1002/pssc.200777779

    78. Ultra-thin silicon solar cell: Modelling and characterisation (pages 1407–1410)

      L. Danos, G. Jones, R. Greef and T. Markvart

      Article first published online: 7 MAR 2008 | DOI: 10.1002/pssc.200777809

    79. Determination of linear birefringence of a multiple-order wave plate using a phase-sensitive ellipsometer (pages 1411–1413)

      H. C. Wei, C. H. Hsieh, C. C. Tsai, L. P. Yu and C. Chou

      Article first published online: 7 MAR 2008 | DOI: 10.1002/pssc.200777812

    80. Application of ellipsometry in immersion lithography (pages 1414–1418)

      H. Jeong, H. Cheon, J. Kyoung, H. Oh and I. An*

      Article first published online: 19 MAR 2008 | DOI: 10.1002/pssc.200777867

    81. Analysis of T. Lanuginosus lipase growth on octadecanthiol using surface plasmon resonance ellipsometry (pages 1419–1422)

      Z. Balevicius, V. Vaicikauskas, G. Valincius and I. Ignatjev

      Article first published online: 20 FEB 2008 | DOI: 10.1002/pssc.200777752

    82. Polarimetric imaging for the diagnosis of cervical cancer (pages 1423–1426)

      M. Anastasiadou, A. De Martino, D. Clement, F. Liège, B. Laude-Boulesteix, N. Quang, J. Dreyfuss, B. Huynh, A. Nazac, L. Schwartz and H. Cohen

      Article first published online: 19 MAR 2008 | DOI: 10.1002/pssc.200777805

    83. Ellipsometric characterization of flagellin films for biosensor applications (pages 1427–1430)

      P. Kozma, N. Nagy, S. Kurunczi, P. Petrik, A. Hámori, A. Muskotál, F. Vonderviszt, M. Fried and I. Bársony

      Article first published online: 17 MAR 2008 | DOI: 10.1002/pssc.200777845

    84. Immunodetection using computer screen photo-assisted ellipsometry (pages 1431–1433)

      J. W. P. Bakker, H. Arwin, I. Lundström and D. Filippini

      Article first published online: 17 MAR 2008 | DOI: 10.1002/pssc.200777861

    85. Thermal behaviour of chitosan and chitin thin films studied by spectroscopic ellipsometry (pages 1434–1437)

      Z. Montiel-González, G. Luna-Bárcenas and A. Mendoza-Galván

      Article first published online: 17 MAR 2008 | DOI: 10.1002/pssc.200777874

    86. Infrared ellipsometry studies of thermal stability of protein monolayers and multilayers (pages 1438–1441)

      H. Arwin, A. Askendahl, P. Tengvall, D. W. Thompson and J. A. Woollam

      Article first published online: 17 MAR 2008 | DOI: 10.1002/pssc.200777898

  5. Information for authors

    1. Top of page
    2. Cover Picture
    3. Contents
    4. Preface
    5. Contributed Articles
    6. Information for authors

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