Cover Picture: Luminescence imaging for inline characterisation in silicon photovoltaics (Phys. Status Solidi RRL 4/2011)

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Abstract

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The growing pressure in photovoltaics (PV) production to achieve higher cell efficiencies at low cost is requiring improved quality control and process monitoring tools. With its contactless and non-destructive nature and short measurement times, photoluminescence (PL) imaging is perfectly suited to be used for such inline monitoring across the entire PV value chain. Megapixel PL images on silicon bricks, unprocessed wafers, partially processed wafers and fully processed cells can be captured with acquisition times of typically a few seconds or less than one second. In their Review@RRL article (pp. 131–137), Trupke et al. review several specific PL imaging applications allowing quantitative spatial information to be gained about a variety of crucial material and device parameters. The cover image shows a detail of the PL image taken on a compensated 6 × 6 inch silicon brick.

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