Reliability Assessment of Metallized Film Capacitors using Reduced Degradation Test Sample
Article first published online: 27 JAN 2012
Copyright © 2012 John Wiley & Sons, Ltd.
Quality and Reliability Engineering International
Volume 29, Issue 2, pages 259–265, March 2013
How to Cite
Sun, Q., Tang, Y., Feng, J. and Jin, T. (2013), Reliability Assessment of Metallized Film Capacitors using Reduced Degradation Test Sample. Qual. Reliab. Engng. Int., 29: 259–265. doi: 10.1002/qre.1307
- Issue published online: 18 FEB 2013
- Article first published online: 27 JAN 2012
- Manuscript Accepted: 22 NOV 2011
- Manuscript Revised: 10 OCT 2011
- Manuscript Received: 15 MAR 2011
- National Science Foundation of China. Grant Number: 60804054
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