Measuring the Process Yield for Simple Linear Profiles with one-Sided Specification
Article first published online: 11 JUL 2013
Copyright © 2013 John Wiley & Sons, Ltd.
Quality and Reliability Engineering International
Volume 30, Issue 8, pages 1145–1151, December 2014
How to Cite
2014), Measuring the Process Yield for Simple Linear Profiles with one-Sided Specification, Qual. Reliab. Engng. Int., 30, pages 1145–1151, doi: 10.1002/qre.1537(
- Issue published online: 21 NOV 2014
- Article first published online: 11 JUL 2013
- Manuscript Accepted: 28 APR 2013
- Manuscript Received: 8 APR 2013
- simple linear profiles;
- one-sided specification;
- process yield;
- lower confidence bound
Profile monitoring is mainly for checking the stability of the relationship between response and explanatory variables over time based on observed data. Linear profiles are common in calibration applications. In this study, we develop two new indices for measuring the process yield for simple linear profiles with one-sided specification. The asymptotic distribution of the estimated index is provided. The approximate lower confidence bound for the true process yield is also obtained and used to determine whether the process yield meets the quality requirement. A simulation study is conducted to assess the performance of the proposed method. The results show that the coverage rates of the confidence intervals for all simulated cases are greater than the 95% lower limit of the stated nominal value. One real example is used to illustrate the applicability of the proposed approach. Copyright © 2013 John Wiley & Sons, Ltd.