Quality and Reliability Engineering International

Cover image for Vol. 28 Issue 8

December 2012

Volume 28, Issue 8

Pages 793–991

  1. Editorial

    1. Top of page
    2. Editorial
    3. Review Article
    4. Research Articles
    5. Short Communication
    6. Call for Papers
  2. Review Article

    1. Top of page
    2. Editorial
    3. Review Article
    4. Research Articles
    5. Short Communication
    6. Call for Papers
  3. Research Articles

    1. Top of page
    2. Editorial
    3. Review Article
    4. Research Articles
    5. Short Communication
    6. Call for Papers
    1. Random Effects Model for Attribute Gauge R&R (pages 807–823)

      Emese Vágó and Sándor Kemény

      Article first published online: 26 OCT 2011 | DOI: 10.1002/qre.1269

    2. Improving Product Quality and Reliability with Customer Experience Data (pages 873–886)

      Aarnout Brombacher, Eva Hopma, Ashwin Ittoo, Yuan Lu, Ilse Luyk, Laura Maruster, Joël Ribeiro, Ton Weijters and Hans Wortmann

      Article first published online: 9 DEC 2011 | DOI: 10.1002/qre.1277

    3. Reliability-Based Design Optimization Considering Probabilistic Degradation Behavior (pages 911–923)

      Vijay Rathod, Om Prakash Yadav, Ajay Rathore and Rakesh Jain

      Article first published online: 10 JAN 2012 | DOI: 10.1002/qre.1281

    4. On the Monitoring of Simple Linear Berkson Profiles (pages 949–965)

      Yi-Hua Tina Wang and Longcheen Huwang

      Article first published online: 10 JAN 2012 | DOI: 10.1002/qre.1286

    5. A Spatiotemporal Method for the Monitoring of Image Data (pages 967–980)

      Fadel M. Megahed, Lee J. Wells, Jaime A. Camelio and William H. Woodall

      Article first published online: 10 JAN 2012 | DOI: 10.1002/qre.1287

  4. Short Communication

    1. Top of page
    2. Editorial
    3. Review Article
    4. Research Articles
    5. Short Communication
    6. Call for Papers
  5. Call for Papers

    1. Top of page
    2. Editorial
    3. Review Article
    4. Research Articles
    5. Short Communication
    6. Call for Papers

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