Quality and Reliability Engineering International

Cover image for Vol. 29 Issue 5

July 2013

Volume 29, Issue 5

Pages 619–778

  1. Editorial

    1. Top of page
    2. Editorial
    3. Research Articles
    1. You have free access to this content
      Editorial (page 619)

      Version of Record online: 25 JUL 2013 | DOI: 10.1002/qre.1565

  2. Research Articles

    1. Top of page
    2. Editorial
    3. Research Articles
    1. The Effect of Parameter Estimation on Upper-sided Bernoulli Cumulative Sum Charts (pages 639–651)

      Jaeheon Lee, Ning Wang, Liaosa Xu, Anna Schuh and William H. Woodall

      Version of Record online: 16 MAY 2012 | DOI: 10.1002/qre.1413

    2. CS-EWMA Chart for Monitoring Process Dispersion (pages 653–663)

      Nasir Abbas, Muhammad Riaz and Ronald J. M. M. Does

      Version of Record online: 5 JUN 2012 | DOI: 10.1002/qre.1414

    3. A Generalized Likelihood Ratio Chart for Monitoring Bernoulli Processes (pages 665–679)

      Wandi Huang, Sai Wang and Marion R. Reynolds Jr.

      Version of Record online: 18 JUN 2012 | DOI: 10.1002/qre.1416

    4. An Economic Approach to the Management of High-Quality Processes (pages 681–690)

      Şebnem Yılmaz and Nimetullah Burnak

      Version of Record online: 10 MAY 2012 | DOI: 10.1002/qre.1417

    5. Acquisition and Testing, DT/OT Testing: The Need for Two-Parameter Requirements (pages 691–697)

      Raymond R. Hill, Alex J. Gutman, Stephen P. Chambal and Jerry W. Kitchen

      Version of Record online: 20 JUN 2012 | DOI: 10.1002/qre.1419

    6. Reliability Prediction Based on Variation Mode and Effect Analysis (pages 699–708)

      Jonas Pavasson, Kent Cronholm, Henrik Strand and Magnus Karlberg

      Version of Record online: 18 JUN 2012 | DOI: 10.1002/qre.1420

    7. The Use of Probability Limits of COM–Poisson Charts and their Applications (pages 759–770)

      Aamir Saghir, Zhengyan Lin, Saddam Akber Abbasi and Shabbir Ahmad

      Version of Record online: 3 JUL 2012 | DOI: 10.1002/qre.1426

    8. A Response Surface Methodology for Modeling Time Series Response Data (pages 771–778)

      Scott M. Storm, Raymond R. Hill and Joseph J. Pignatiello Jr.

      Version of Record online: 13 AUG 2012 | DOI: 10.1002/qre.1427

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