Structural analysis of secondary ions by post-source decay in time-of-flight secondary ion mass spectrometry
Article first published online: 30 JAN 2006
Copyright © 2006 John Wiley & Sons, Ltd.
Rapid Communications in Mass Spectrometry
Volume 20, Issue 4, pages 703–709, 28 February 2006
How to Cite
Touboul, D., Brunelle, A. and Laprévote, O. (2006), Structural analysis of secondary ions by post-source decay in time-of-flight secondary ion mass spectrometry. Rapid Commun. Mass Spectrom., 20: 703–709. doi: 10.1002/rcm.2362
- Issue published online: 30 JAN 2006
- Article first published online: 30 JAN 2006
- Manuscript Accepted: 28 DEC 2005
- Manuscript Received: 14 NOV 2005
- Institut de Chimie des Substances Naturelles
Tandem mass spectrometry measurements have been achieved using time-of-flight secondary ion mass spectrometry (TOF-SIMS) and a post source decay (PSD)-like method. The performance of the method has been demonstrated on model molecules with well-known fragmentation pathways. Several lipids have been fragmented including the phosphocholine ion, phosphatidylcholines, cholesterol and vitamin E. Pure samples were analyzed, and the results compared with those obtained with the same compounds on a quadrupole-TOF hybrid mass spectrometer. Then, the structures of some lipids which are currently observed in the TOF-SIMS imaging of mammalian tissue sections were verified. Copyright © 2006 John Wiley & Sons, Ltd.