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Structural analysis of secondary ions by post-source decay in time-of-flight secondary ion mass spectrometry

Authors

  • David Touboul,

    1. Laboratoire de Spectrométrie de Masse, Institut de Chimie des Substances Naturelles, CNRS, UPR 2301 Av. de la Terrasse, 91198 Gif-sur-Yvette Cedex, France
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  • Alain Brunelle,

    Corresponding author
    1. Laboratoire de Spectrométrie de Masse, Institut de Chimie des Substances Naturelles, CNRS, UPR 2301 Av. de la Terrasse, 91198 Gif-sur-Yvette Cedex, France
    • Laboratoire de Spectrométrie de Masse, Institut de Chimie des Substances Naturelles, CNRS, UPR 2301 Av. de la Terrasse, 91198 Gif-sur-Yvette Cedex, France.
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  • Olivier Laprévote

    1. Laboratoire de Spectrométrie de Masse, Institut de Chimie des Substances Naturelles, CNRS, UPR 2301 Av. de la Terrasse, 91198 Gif-sur-Yvette Cedex, France
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Abstract

Tandem mass spectrometry measurements have been achieved using time-of-flight secondary ion mass spectrometry (TOF-SIMS) and a post source decay (PSD)-like method. The performance of the method has been demonstrated on model molecules with well-known fragmentation pathways. Several lipids have been fragmented including the phosphocholine ion, phosphatidylcholines, cholesterol and vitamin E. Pure samples were analyzed, and the results compared with those obtained with the same compounds on a quadrupole-TOF hybrid mass spectrometer. Then, the structures of some lipids which are currently observed in the TOF-SIMS imaging of mammalian tissue sections were verified. Copyright © 2006 John Wiley & Sons, Ltd.

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