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Letter to the Editor
Dual-beam versus single-beam depth profiling: Same sample in same instrument
Article first published online: 11 NOV 2013
Copyright © 2013 John Wiley & Sons, Ltd.
Rapid Communications in Mass Spectrometry
Volume 27, Issue 24, pages 2828–2832, 30 December 2013
How to Cite
Baryshev, S. V., Becker, N. G., Zinovev, A. V., Tripa, C. E. and Veryovkin, I. V. (2013), Dual-beam versus single-beam depth profiling: Same sample in same instrument. Rapid Commun. Mass Spectrom., 27: 2828–2832. doi: 10.1002/rcm.6749
- Issue published online: 31 OCT 2013
- Article first published online: 11 NOV 2013
- Manuscript Accepted: 25 SEP 2013
- Manuscript Revised: 24 SEP 2013
- Manuscript Received: 29 JUL 2013