Non-destructive plasticizer screening using a direct inlet probe-atmospheric pressure chemical ionization source and ion trap mass spectrometry
In recent years, several ambient ionization techniques, where solid and/or liquid samples are brought directly into the ion source without any sample preparation and chromatographic separation, have been introduced for mass spectrometric (MS) analyses. Using the direct inlet probe–atmospheric pressure chemical ionization (DIP-APCI)-MS and DIP-APCI-MSn methods presented here, a non-destructive screening analysis for plasticizers directly from plastic articles can be performed.
The DIP-APCI ion source developed in our laboratory uses a temperature-programmed push rod to introduce solid or liquid samples into a homemade APCI ion source. The DIP-APCI ion source was coupled to an ion trap (IT) mass spectrometer and selected source parameters were optimized. To enable a screening analysis for plasticizers, standards substances of several phthalates and other plasticizers were analyzed and their fragmentation behavior during collision-induced dissociation (CID) was studied.
Using DIP-APCI-ITMS, plasticizers can be detected directly from plastic articles and identification is possible through MSn experiments. For example, the isomeric phthalates di(2-ethylhexyl) phthalate and di-n-octyl phthalate can be differentiated according to their fragmentation behavior.
There are several advantages of the DIP-APCI source in comparison to many other ambient desorption ion sources: (i) well-defined gas phase matrix, (ii) precisely adjustable reagent gases (e.g. O2 for negative APCI), (iii) well-defined probe temperature, and (iv) fully automated operation. Copyright © 2014 John Wiley & Sons, Ltd.