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Robust synchronization of complex switched networks with parametric uncertainties and two types of delays

Authors

  • Yan-Wu Wang,

    1. Department of Control Science and Engineering, Huazhong University of Science and Technology, Wuhan, China
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  • Tao Bian,

    1. Department of Control Science and Engineering, Huazhong University of Science and Technology, Wuhan, China
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  • Jiang-Wen Xiao,

    Corresponding author
    • Department of Control Science and Engineering, Huazhong University of Science and Technology, Wuhan, China
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  • Yuehua Huang

    1. Department of Control Science and Engineering, Huazhong University of Science and Technology, Wuhan, China
    2. College of Electrical Engineering and Information Science, China Three Gorges University, Yichang, China
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Jiang-Wen Xiao, Department of Control Science and Engineering, Huazhong University of Science and Technology, Wuhan 430074, China.

E-mail: jwxiao@mail.hust.edu.cn

SUMMARY

In this paper, a complex switched network (CSN) with parametric uncertainties and two types of time-varying delays is presented. The CSN contains switching behaviors on both its nodes and the network topology. Different from those CSNs studied in the literatures, the switching mode dominating the nodes systems is independent with that dominating the network topology. The two types of time-varying delays are the system delay in the node and the coupling delay between nodes and they have different values. The inherent synchronization properties of the CSN were investigated not subject to any controllers, and sufficient conditions for the global robust exponential synchronizations are obtained by defining a piecewise Lyapunov–Krasovskii function. Both the case with known derivative of delays and the case with unknown or nonexistent derivative of delays are investigated. Two special cases, i.e. the network without coupling delay and the network without switching behaviors and coupling delay, are studied. Illustrated examples are presented to show the effectiveness of the proposed methods. Copyright © 2011 John Wiley & Sons, Ltd.

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