Acquisition parameters optimization of a transmission electron forward scatter diffraction system in a cold-field emission scanning electron microscope for nanomaterials characterization
Version of Record online: 25 FEB 2013
© Wiley Periodicals, Inc.
Volume 35, Issue 6, pages 375–386, November-December 2013
How to Cite
Brodusch, N., Demers, H., Trudeau, M. and Gauvin, R. (2013), Acquisition parameters optimization of a transmission electron forward scatter diffraction system in a cold-field emission scanning electron microscope for nanomaterials characterization. Scanning, 35: 375–386. doi: 10.1002/sca.21078
- Issue online: 19 DEC 2013
- Version of Record online: 25 FEB 2013
- Manuscript Accepted: 2 JAN 2013
- Manuscript Received: 5 OCT 2012
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