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Short Communication
Summary of ISO/TC 201 standard: XVIII, ISO 19318:2004—surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of methods used for charge control and charge correction
Article first published online: 7 MAR 2005
DOI: 10.1002/sia.2034
Copyright © 2005 John Wiley & Sons, Ltd.
1096-9918/asset/cover.gif?v=1&s=9c11e7947d7d46fc3f061ed909fc9d2f0e6d7928 "Surface and Interface Analysis")
Additional Information
How to Cite
Baer, D. R. (2005), Summary of ISO/TC 201 standard: XVIII, ISO 19318:2004—surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of methods used for charge control and charge correction. Surf. Interface Anal., 37: 524–526. doi: 10.1002/sia.2034
Publication History
- Issue published online: 9 MAY 2005
- Article first published online: 7 MAR 2005
- Manuscript Revised: 6 DEC 2004
- Manuscript Accepted: 6 DEC 2004
- Manuscript Received: 1 DEC 2004
- Abstract
- References
- Cited By
Keywords:
- XPS;
- x-ray photoelectron spectroscopy;
- specimen charging;
- charge referencing;
- charge compensation;
- ISO;
- International Organization for Standardization
Abstract
International Standard ISO 19318 specifies the minimum amount of information describing the methods of charge control and charge correction in measurements of core-level binding energies for insulating specimens by x-ray photoelectron spectroscopy, which is to be reported with the analytical results. Information is also provided on methods that have been found useful for charge control and charge correction in the measurement of binding energies. Copyright © 2005 John Wiley & Sons, Ltd.