ToF-SIMS studies of the oxidation of Fe by D2O vapour: comparison with XPS
Article first published online: 18 FEB 2005
Copyright © 2005 John Wiley & Sons, Ltd.
Surface and Interface Analysis
Volume 37, Issue 5, pages 495–498, May 2005
How to Cite
Grosvenor, A. P., Francis, J. T., Kobe, B. A. and McIntyre, N. S. (2005), ToF-SIMS studies of the oxidation of Fe by D2O vapour: comparison with XPS. Surf. Interface Anal., 37: 495–498. doi: 10.1002/sia.2039
- Issue published online: 9 MAY 2005
- Article first published online: 18 FEB 2005
- Manuscript Accepted: 31 DEC 2004
- Manuscript Revised: 29 NOV 2004
- Manuscript Received: 4 OCT 2004
- Fe, oxidation;
The oxidation of iron (Fe) by water (D2O) vapour at low pressures and room temperature was investigated using time-of-flight (ToF) SIMS. The results supported those found previously using XPS and the QUASES™ program in that a duplex oxide structure was found containing a thin outer surface hydroxide (Fe(OD)2) layer over an inner oxide (FeO) layer. The extraordinary depth resolution of the ToF-SIMS profiles assisted in identifying the two phases; this resolution was achieved by compensation for surface roughness. A substantial concentration of deuterium was found in the subsurface oxide layer. This observation confirmed previous assessments that the formation of FeO was from the reaction of Fe(OD)2 with outward-diffusing Fe, leaving deuterium as a reaction product. Copyright © 2005 John Wiley & Sons, Ltd.