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Improving surface-analysis methods for characterization of advanced materials by development of standards, reference data, and interlaboratory comparisons†
Article first published online: 6 FEB 2007
DOI: 10.1002/sia.2508
This article is a US Government work and is in the public domain in the USA. Published in 2007 by John Wiley & Sons, Ltd.
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How to Cite
Baer, D. R. (2007), Improving surface-analysis methods for characterization of advanced materials by development of standards, reference data, and interlaboratory comparisons. Surf. Interface Anal., 39: 283–293. doi: 10.1002/sia.2508
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Publication History
- Issue published online: 22 MAR 2007
- Article first published online: 6 FEB 2007
- Manuscript Accepted: 31 AUG 2006
- Manuscript Revised: 30 AUG 2006
- Manuscript Received: 18 JUL 2006
Funded by
- U.S. Department of Energy
- Abstract
- References
- Cited By
Keywords:
- surface analysis;
- X-ray photoelectron spectroscopy;
- XPS;
- Auger electron spectroscopy;
- AES;
- surface standards;
- reference data;
- advanced materials analysis;
- ISO TC201;
- ASTM E42
Abstract
This paper summarizes the results of two surveys examining current needs for improved analyses of surfaces. Surfaces and interfaces are increasingly important to science and technologies associated with nanoparticles, nano-structured materials and other complex materials including those associated with information systems and medical or biological applications. Adequate characterization of advanced materials frequently requires application of more than one analysis method along with the need to analyze data in increasingly sophisticated and sometimes interrelated ways. It is useful for both new and experienced analysts to have ready access to best practices for obtaining accurate and useful information from a variety of different analysis tools. The International Organization for Standardization (ISO) Committee TC 201 on surface chemical analysis and the ASTM Committee E-42 on surface analysis are working to address these needs by assembling guides and standards reflecting the collective experience and wisdom of experts in this community. Published in 2007 by John Wiley & Sons, Ltd