Annealing effect on the structural and magnetic properties of nickel ferrite thin films
Article first published online: 17 FEB 2010
Copyright © 2010 John Wiley & Sons, Ltd.
Surface and Interface Analysis
Volume 42, Issue 3, pages 151–156, March 2010
How to Cite
Dixit, G., Singh, J. P., Srivastava, R. C., Agrawal, H. M., Choudhary, R. J. and Gupta, A. (2010), Annealing effect on the structural and magnetic properties of nickel ferrite thin films. Surf. Interface Anal., 42: 151–156. doi: 10.1002/sia.3195
- Issue published online: 17 FEB 2010
- Article first published online: 17 FEB 2010
- Manuscript Revised: 22 DEC 2009
- Manuscript Accepted: 22 DEC 2009
- Manuscript Received: 17 JUN 2009
- thin films;
- Raman spectroscopy;
Nickel ferrite is a soft magnetic material with inverse spinel structure. Soft ferrite films are used in microwave devices, integrated planar circuits, etc., because of their high resistivity. In this work, thin films of nickel ferrite were deposited on Si (100) substrate by using pulsed laser deposition (PLD) technique. The thickness of the film was measured by surface profilometer and also by X-ray reflectivity (XRR). The films were annealed at three different temperatures to observe the effect on the structural and magnetic properties of the film. The films were characterised by X-ray diffraction (XRD), Raman spectroscopy and vibrating sample magnetometer (VSM) to study the structural and magnetic properties. Copyright © 2010 John Wiley & Sons, Ltd.