Research Article

Characterization of P3HT/PCBM bulk heterojunction photovoltaic devices using advanced secondary ion mass spectrometry techniques†

  1. J.-N. Audinot1,*,
  2. P. Lévêque2,
  3. R. Bechara2,
  4. N. Leclerc3,
  5. J. Guillot1,
  6. H.-N. Migeon1,
  7. G. Hadziioannou3,
  8. T. Heiser2

Article first published online: 29 MAR 2010

DOI: 10.1002/sia.3359

Issue

Surface and Interface Analysis

Surface and Interface Analysis

Special Issue: ECASIA '09

Volume 42, Issue 6-7, pages 1010–1013, June - July 2010

Additional Information

How to Cite

Audinot, J.-N., Lévêque, P., Bechara, R., Leclerc, N., Guillot, J., Migeon, H.-N., Hadziioannou, G. and Heiser, T. (2010), Characterization of P3HT/PCBM bulk heterojunction photovoltaic devices using advanced secondary ion mass spectrometry techniques. Surf. Interface Anal., 42: 1010–1013. doi: 10.1002/sia.3359

Author Information

  1. 1

    Department Science and Analysis of Materials, Public Research Centre Gabriel Lippmann, 41, rue du Brill, L-4422 Belvaux, Luxembourg

  2. 2

    Institut d'Électronique du Solide et des Systèmes, Centre National de la Recherche Scientifique, Université Louis Pasteur, 23, Rue du Loess, 67 037 Strasbourg, France

  3. 3

    Laboratoire d'Ingénierie des Polymères pour les Hautes Technologies, Université Louis Pasteur, Ecole Européenne de Chimie, Polymères et Matériaux, 25, Rue Becquerel, 67087 Strasbourg, France

*Department Science and Analysis of Materials, Public Research Centre Gabriel Lippmann, 41, rue du Brill, L-4422 Belvaux, Luxembourg.

  1. †

    Paper published as part of the ECASIA 2009 special issue.

Publication History

  1. Issue published online: 17 JUN 2010
  2. Article first published online: 29 MAR 2010
  3. Manuscript Accepted: 8 FEB 2010
  4. Manuscript Revised: 2 FEB 2010
  5. Manuscript Received: 21 AUG 2009

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Keywords:

  • SIMS;
  • organic photovoltaic;
  • organic film;
  • diffusion

Abstract

In this work, we applied low-impact energy secondary ion mass spectrometry (known as Sc-Ultra SIMS) and high lateral resolution (NanoSIMS50) to characterize the P3HT/PCBM (poly(3-hexylthiophene)/phenyl C61-butyric acid methyl ester bulk heterojunction photovoltaic (PV) devices. Here we report results obtained on Al/P3HT:PCBM/PEDOT:PSS/ITO (poly(3-hexylthiophene:phenyl C61-butyric acid methyl ester/poly(ethylene-dioxythiophene):poly(styrene sulfonate)/indium tin oxide) using advanced SIMS measurements to monitor 3D molecular compositions and metal/organic interface. The measurements have been performed on as-deposited as well as-annealed samples of Al/polymer interface. Blend macrophase separation and polymer/fullerene distribution have been investigated. Copyright © 2010 John Wiley & Sons, Ltd.

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