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Characterization of P3HT/PCBM bulk heterojunction photovoltaic devices using advanced secondary ion mass spectrometry techniques

Authors

  • J.-N. Audinot,

    Corresponding author
    1. Department Science and Analysis of Materials, Public Research Centre Gabriel Lippmann, 41, rue du Brill, L-4422 Belvaux, Luxembourg
    • Department Science and Analysis of Materials, Public Research Centre Gabriel Lippmann, 41, rue du Brill, L-4422 Belvaux, Luxembourg.
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  • P. Lévêque,

    1. Institut d'Électronique du Solide et des Systèmes, Centre National de la Recherche Scientifique, Université Louis Pasteur, 23, Rue du Loess, 67 037 Strasbourg, France
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  • R. Bechara,

    1. Institut d'Électronique du Solide et des Systèmes, Centre National de la Recherche Scientifique, Université Louis Pasteur, 23, Rue du Loess, 67 037 Strasbourg, France
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  • N. Leclerc,

    1. Laboratoire d'Ingénierie des Polymères pour les Hautes Technologies, Université Louis Pasteur, Ecole Européenne de Chimie, Polymères et Matériaux, 25, Rue Becquerel, 67087 Strasbourg, France
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  • J. Guillot,

    1. Department Science and Analysis of Materials, Public Research Centre Gabriel Lippmann, 41, rue du Brill, L-4422 Belvaux, Luxembourg
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  • H.-N. Migeon,

    1. Department Science and Analysis of Materials, Public Research Centre Gabriel Lippmann, 41, rue du Brill, L-4422 Belvaux, Luxembourg
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  • G. Hadziioannou,

    1. Laboratoire d'Ingénierie des Polymères pour les Hautes Technologies, Université Louis Pasteur, Ecole Européenne de Chimie, Polymères et Matériaux, 25, Rue Becquerel, 67087 Strasbourg, France
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  • T. Heiser

    1. Institut d'Électronique du Solide et des Systèmes, Centre National de la Recherche Scientifique, Université Louis Pasteur, 23, Rue du Loess, 67 037 Strasbourg, France
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  • Paper published as part of the ECASIA 2009 special issue.

Abstract

In this work, we applied low-impact energy secondary ion mass spectrometry (known as Sc-Ultra SIMS) and high lateral resolution (NanoSIMS50) to characterize the P3HT/PCBM (poly(3-hexylthiophene)/phenyl C61-butyric acid methyl ester bulk heterojunction photovoltaic (PV) devices. Here we report results obtained on Al/P3HT:PCBM/PEDOT:PSS/ITO (poly(3-hexylthiophene:phenyl C61-butyric acid methyl ester/poly(ethylene-dioxythiophene):poly(styrene sulfonate)/indium tin oxide) using advanced SIMS measurements to monitor 3D molecular compositions and metal/organic interface. The measurements have been performed on as-deposited as well as-annealed samples of Al/polymer interface. Blend macrophase separation and polymer/fullerene distribution have been investigated. Copyright © 2010 John Wiley & Sons, Ltd.

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