The density of interface states and their relaxation times in Au/Bi4Ti3O12/SiO2/n-Si(MFIS) structures
Article first published online: 24 FEB 2011
Copyright © 2011 John Wiley & Sons, Ltd.
Surface and Interface Analysis
Volume 43, Issue 13, pages 1561–1565, December 2011
How to Cite
Bülbül, M. M., Altındal, Ş., Parlaktürk, F. and Tataroğlu, A. (2011), The density of interface states and their relaxation times in Au/Bi4Ti3O12/SiO2/n-Si(MFIS) structures. Surf. Interface Anal., 43: 1561–1565. doi: 10.1002/sia.3749
- Issue published online: 10 NOV 2011
- Article first published online: 24 FEB 2011
- Manuscript Revised: 20 JAN 2011
- Manuscript Accepted: 20 JAN 2011
- Manuscript Received: 20 SEP 2010
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