SIMS proceedings paper
Investigations of molecular depth profiling with dual beam sputtering
Version of Record online: 19 JAN 2012
Copyright © 2012 John Wiley & Sons, Ltd.
Surface and Interface Analysis
Special Issue: Proceedings of the Eighteenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVIII, Riva Del Garda, Trento, Italy, September 18 - 23, 2011
Volume 45, Issue 1, pages 175–177, January 2013
How to Cite
Lu, C., Wucher, A. and Winograd, N. (2013), Investigations of molecular depth profiling with dual beam sputtering. Surf. Interface Anal., 45: 175–177. doi: 10.1002/sia.4838
- Issue online: 18 DEC 2012
- Version of Record online: 19 JAN 2012
- Manuscript Accepted: 19 DEC 2011
- Manuscript Revised: 7 DEC 2011
- Manuscript Received: 27 SEP 2011
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