SIMS proceedings paper
Quantitative grain boundary analysis of bulk samples by SIMS
Article first published online: 15 FEB 2012
Copyright © 2012 John Wiley & Sons, Ltd.
Surface and Interface Analysis
Special Issue: Proceedings of the Eighteenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVIII, Riva Del Garda, Trento, Italy, September 18 - 23, 2011
Volume 45, Issue 1, pages 305–308, January 2013
How to Cite
Christien, F., Downing, C., Moore, K. L. and Grovenor, C. R. M. (2013), Quantitative grain boundary analysis of bulk samples by SIMS. Surf. Interface Anal., 45: 305–308. doi: 10.1002/sia.4884
- Issue published online: 18 DEC 2012
- Article first published online: 15 FEB 2012
- Manuscript Accepted: 12 JAN 2012
- Manuscript Revised: 19 DEC 2011
- Manuscript Received: 27 SEP 2011
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