SIMS proceedings paper
Sputtered ion emission under size-selected Arn+ cluster ion bombardment
Article first published online: 28 FEB 2012
Copyright © 2012 John Wiley & Sons, Ltd.
Surface and Interface Analysis
Special Issue: Proceedings of the Eighteenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVIII, Riva Del Garda, Trento, Italy, September 18 - 23, 2011
Volume 45, Issue 1, pages 138–142, January 2013
How to Cite
Gnaser, H., Ichiki, K. and Matsuo, J. (2013), Sputtered ion emission under size-selected Arn+ cluster ion bombardment. Surf. Interface Anal., 45: 138–142. doi: 10.1002/sia.4914
- Issue published online: 18 DEC 2012
- Article first published online: 28 FEB 2012
- Manuscript Accepted: 2 FEB 2012
- Manuscript Revised: 3 DEC 2011
- Manuscript Received: 7 OCT 2011
- Deutscher Akademischer Austausch Dienst (DAAD)
- Japan Society for the Promotion of Science (JSPS)
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