SIMS proceedings paper
Surface sputtering with nanoclusters: the relevant parameters
Version of Record online: 1 MAR 2012
Copyright © 2012 John Wiley & Sons, Ltd.
Surface and Interface Analysis
Special Issue: Proceedings of the Eighteenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVIII, Riva Del Garda, Trento, Italy, September 18 - 23, 2011
Volume 45, Issue 1, pages 9–13, January 2013
How to Cite
Delcorte, A., Restrepo, O. A., Czerwinski, B. and Garrison, B. J. (2013), Surface sputtering with nanoclusters: the relevant parameters. Surf. Interface Anal., 45: 9–13. doi: 10.1002/sia.4926
- Issue online: 18 DEC 2012
- Version of Record online: 1 MAR 2012
- Manuscript Accepted: 8 FEB 2012
- Manuscript Revised: 7 FEB 2012
- Manuscript Received: 2 OCT 2011
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