SIMS proceedings paper
Structural analysis and depth profiling of nanometric SiO2/SRO multilayers
Article first published online: 27 MAR 2012
Copyright © 2012 John Wiley & Sons, Ltd.
Surface and Interface Analysis
Special Issue: Proceedings of the Eighteenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVIII, Riva Del Garda, Trento, Italy, September 18 - 23, 2011
Volume 45, Issue 1, pages 373–375, January 2013
How to Cite
Barozzi, M., Gennaro, S., Bersani, M., Vanzetti, L., Jestin, Y., Pucker, G., Milita, S. and Balboni, R. (2013), Structural analysis and depth profiling of nanometric SiO2/SRO multilayers. Surf. Interface Anal., 45: 373–375. doi: 10.1002/sia.4939
- Issue published online: 18 DEC 2012
- Article first published online: 27 MAR 2012
- Manuscript Accepted: 2 MAR 2012
- Manuscript Revised: 29 FEB 2012
- Manuscript Received: 30 SEP 2011
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