SIMS proceedings paper
A statistical interpretation of molecular delta layer depth profiles
Version of Record online: 25 APR 2012
Copyright © 2012 John Wiley & Sons, Ltd.
Surface and Interface Analysis
Special Issue: Proceedings of the Eighteenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVIII, Riva Del Garda, Trento, Italy, September 18 - 23, 2011
Volume 45, Issue 1, pages 39–41, January 2013
How to Cite
Wucher, A., Krantzman, K.D., Lu, C. and Winograd, N. (2013), A statistical interpretation of molecular delta layer depth profiles. Surf. Interface Anal., 45: 39–41. doi: 10.1002/sia.4966
- Issue online: 18 DEC 2012
- Version of Record online: 25 APR 2012
- Manuscript Accepted: 13 MAR 2012
- Manuscript Revised: 8 MAR 2012
- Manuscript Received: 14 OCT 2011
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