SIMS proceedings paper
The cryo-TOF-SIMS/SEM system for the analysis of the chemical distribution in freeze-fixed Cryptomeria japonica wood
Version of Record online: 12 APR 2012
Copyright © 2012 John Wiley & Sons, Ltd.
Surface and Interface Analysis
Special Issue: Proceedings of the Eighteenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVIII, Riva Del Garda, Trento, Italy, September 18 - 23, 2011
Volume 45, Issue 1, pages 215–219, January 2013
How to Cite
Kuroda, K., Fujiwara, T., Imai, T., Takama, R., Saito, K., Matsushita, Y. and Fukushima, K. (2013), The cryo-TOF-SIMS/SEM system for the analysis of the chemical distribution in freeze-fixed Cryptomeria japonica wood. Surf. Interface Anal., 45: 215–219. doi: 10.1002/sia.4979
- Issue online: 18 DEC 2012
- Version of Record online: 12 APR 2012
- Manuscript Accepted: 13 MAR 2012
- Manuscript Revised: 8 MAR 2012
- Manuscript Received: 27 SEP 2011
- KAKENHI. Grant Numbers: 22580188, 21228004
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