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Nuclear safeguards applications using LG-SIMS with automated screening capabilities†

  1. P. Peres1,*,
  2. P. M. L. Hedberg2,
  3. S. Walton3,
  4. N. Montgomery3,
  5. J. B. Cliff4,
  6. F. Rabemananjara1,
  7. M. Schuhmacher1

Article first published online: 11 MAY 2012

DOI: 10.1002/sia.5015

Issue

Surface and Interface Analysis

Surface and Interface Analysis

Special Issue: Proceedings of the Eighteenth International Conference on Secondary Ion Mass Spectrometry, SIMS XVIII, Riva Del Garda, Trento, Italy, September 18 - 23, 2011

Volume 45, Issue 1, pages 561–565, January 2013

Additional Information

How to Cite

Peres, P., Hedberg, P. M. L., Walton, S., Montgomery, N., Cliff, J. B., Rabemananjara, F. and Schuhmacher, M. (2013), Nuclear safeguards applications using LG-SIMS with automated screening capabilities. Surf. Interface Anal., 45: 561–565. doi: 10.1002/sia.5015

Author Information

  1. 1

    Cameca, Gennevilliers-Cedex, France

  2. 2

    European Commission, Joint Research Centre, Institute for Transuranium Elements, Karlsruhe, Germany

  3. 3

    AWE, Aldermaston, Reading, United Kingdom

  4. 4

    Centre for Microscopy, Characterisation and Analysis, The University of Western Australia, Crawley, Western Australia, Australia

* P. Peres, Cameca, 29 Quai des Grésillons, 92622 Gennevilliers-Cedex, France.
E-mail: paula.peres@ametek.com

  • †

    This article Nuclear safeguards applications using LG-SIMS with automated screening capabilities was written by Samantha Walton of AWE, Aldermaston, Reading, RG7 4PR, United Kingdom. It is published with the permission of the Controller of HMSO and the Queen's Printer for Scotland.

Publication History

  1. Issue published online: 18 DEC 2012
  2. Article first published online: 11 MAY 2012
  3. Manuscript Accepted: 22 MAR 2012
  4. Manuscript Revised: 25 FEB 2012
  5. Manuscript Received: 30 SEP 2011

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Keywords:

  • SIMS;
  • LG-SIMS;
  • uranium;
  • particles;
  • nuclear safeguards;
  • nuclear forensics;
  • CAMECA;
  • ion microprobe;
  • IMS 1280

A primary tool for detecting undeclared nuclear activities is the analysis of uranium-bearing particles collected on cotton swipes. For many years, secondary ion mass spectrometry (SIMS) has been used as one of the mainstay techniques for particle analysis of nuclear safeguards samples. SIMS is unique in that it is the only technique that can both localize the particles of interest and also provide the isotopic composition of single particles. This paper presents data obtained on standard uranium particle samples using large geometry (LG)-SIMS instruments equipped with the newly developed, automated particle measurement screening software. Both sample screening measurements and microbeam analyses on individual particles are presented. The enhanced performance of the SIMS method for nuclear safeguards applications using LG-SIMS instruments equipped with automated screening capabilities is also discussed. Copyright © 2012 John Wiley & Sons, Ltd. and Crown copyright

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